Products & Services
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Supplier: Cascade Microtech, Inc.
Description: Built-in anti-vibration support
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Electrical Test - Parametric / In-line
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Supplier: Nikon Metrology, Inc.
Description: The Optistation-V offers an ergonomic design and a user-friendly operating environment. This compact-size wafer inspection system also offers high accuracy and high throughput. The Optistation-V macro illuminators simplify visual macro inspections of unevenness, defocus, and other items that had
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Defects / ADC
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Supplier: KLA-Tencor Corporation
Description: KLA-Tencor’s eDR-52xx wafer defect review systems capture high resolution images of wafer defects detected by inspection tools. These images enable defect classification, helping chipmakers to identify systematic defect sources and resolve yield issues. The latest addition to the eDR-52xx
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Photolithography / Patterning
- Measurement Capability: Defects / ADC
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Supplier: MTI Instruments Inc.
Description: The Proforma 300 is completely menu-driven. The on-board intelligence provides fast, accurate, repeatable measurements for all types of wafer materials. Maximum measurement range or maximum probe/wafer stand-off distance can also be adjusted to meet your specific requirements. Features
- Form Factor: Wafer Probing System, Sensor / Sensing Element
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Roughness / Waviness, Shape / Flatness, Thickness - Wafer / Disc (TTV)
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Supplier: Imego
Description: MERMAID is a unique measurement instrument for analysis of liquid and thin film properties using magnetoelastic resonance (MER) sensors. Dynamic events such as viscosity change, phase transitions or bio film growth can be analyzed. The MER sensor can measure properties of either a coating on top of
- Form Factor: Wafer Probing System, Sensor / Sensing Element
- Mounting / Loading: In-situ / System Mounted, Floor Mounted / Stand-alone
- Applications: CVD / PVD Films, Polymers / Photoresists, Other
- Measurement Capability: Deposition Rate, Endpoint Detection / Plasma Diagnostics, Thickness - Film / Layer, Other
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Supplier: TELOPS, Inc.
Description: Test heads for LIV, wavelength and FFP slide above the packages to minimize machine size and package handling. Lasers are aligned using the vision system to achieve test data accuracy . An optical fiber for wavelength can move independently in X & Y to measure each VCSEL accurately .
- Form Factor: Monitor / Instrument, Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Packaged ICs / Ceramic Substrates
- Measurement Capability: Electrical Test - Parametric / In-line, Electrical Test - Wafer Sort / Functional, Other
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Supplier: Hiden Analytical
Description: The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia.
- Form Factor: Controller, Wafer Probing System
- Mounting / Loading: In-situ / System Mounted
- Applications: Etching - Plasma / Wet, Other
- Measurement Capability: Deposition Rate
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Supplier: KLA-Tencor Corporation
Description: SensArray Process Probe 1630 instrumented wafers enable precise in-situ characterization of wafer temperature profiles in both front-end atmospheric and belt CVD systems, and in back-end wafer solder bumping reflow ovens. Utilizing the patented ThermaBond technique, the embedded thermocouple bond
- Form Factor: Wafer Probing System
- Applications: Semiconductor Wafers, CVD / PVD Films, Etching - Plasma / Wet
- Measurement Capability: Other
- Technology: Other
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Featured Products for Wafer Probing System Top
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PREMA Semiconductor GmbH
Prototyping Services for an ASIC Project
In a production hall with an area of 8000m ², PREMA has all process steps required for prototype and high-volume wafer production inhouse. To offer quick prototype cycles we also have an e-beam mask writer that allows us to quickly proceed from layout data to first silicon. Also wafer probing and chip test are located in our building. Steps of an ASIC Project. . An ASIC design has to pass different stages: specification and concept study. circuit design and specification. layout... (read more)
Browse Semiconductor Foundry Services Datasheets for PREMA Semiconductor GmbH -
Qioptiq
Single-Objective Zooming Prober Microscope
Designed for productivity. Built for precision. Priced for value. The New A-Zoom Micro from Qioptiq represents the latest addition to the time-tested line of A-Zoom probing microscopes. Designed for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoom Micro offers a high-value solution for circuit board, semiconductor and. flat-panel display probing without sacrificing features, function or performance. Single-objective design eliminates disruptive... (read more)
Browse Specialty Microscopes Datasheets for Qioptiq
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MEMS Inspection and Testing
MEMS inspection and testing encompasses physical and chemical examination of structures using SEM or optical microscopy, ellipsometry, spectroscopy or other analytical technique. MEMS testing is actual wafer probing or device electrical testing (functional back end testing or parametric in process
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EXPANSIONS AND ACQUISITIONS
to begin in 1999. Maximum capacity will be 6000 8-in. wafers/week. Electroglas, a supplier of automatic wafer probing equipment, has signed a definitive agreement to purchase Knights Technology of Sunnyvale, CA, for approximately $30 million in stock. Knights manufactures software for yield enhancement and
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MICRO: Product Extra!
, lithography, stripping, PVD, etching, wafer probing, and other processes. They're available for use by both OEMs and end-users. Prototyping, in-house foundry casting, and machining are among the services highlighted in the publication. Information: www.durexindustries.com. (Semicon West, S.F., South
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RF Measurement Techniques
is shown in. Figure 1. Author: Date: 10/03/2006. Ron Schmidt. Page 2 of 2. Title: Document No.: Revision: RF Measurement Techniques. BAN-TST-1.1. A. The calibration standards are shown in Figure 2. Figure 2. DC 65 GHz On Wafer Probing (GSG). The increased use of LTCC technology at Barry Industries
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M542: Electrical Characterizations of Packages for use with GaAs MMIC Amplifiers
A test methodology will be presented which combines the advantage of on-wafer RF probing with a TRL calibration to create a completely de-embeddable, novel "test fixture" capable of electrically characterizing most any style package or device. This scheme has been used to characterize many
Engineering Web Search: Wafer Probing System Top
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Test & Precision Measurement Tools - Keithley Instruments...
Wafer Level Reliability Option Reliability Test S500 Integrated Test System 4200-SCS Ultra-fast BTI
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Optical / Imaging System Semiconductor Metrology Instruments...
Wafer Probing System Measurement Capability: »
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Optical / Imaging System Wafer and Thin Film Instrumentation...
Wafer Probing System Measurement Capability: »
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Bare die testing and MCM probing techniques
Bare die testing and MCM probing techniques
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A self-test system architecture for reconfigurable WSI
Keywords: reconfigurable wafer scale integration VLSI IC testing ATE self-test system architecture electronic system testing semiconductor
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Welcome to Cascade Microtech :: Cascade Microtech, Inc.:
Flexible 300 mm Probing Platform Cascade Microtech?s CM300 is a flexible on-wafer
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Oscilloscope Probing System features 30 GHz bandwidth.,...
Oscilloscope Probing System features 30 GHz bandwidth. Oscilloscope Probing System features 30 GHz bandwidth.
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Probing | www.itl.arizona.edu
Probing Probing The UA Imaging Technology Laboratory, with funding from the National Science Foundation, has
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Quality System Manual Quality Handbook
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Methods and apparatuses for improved positioning in a probing...
Methods and apparatuses for improved positioning in a probing system -> Monitor Keywords
