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  • Improvements in Low Power, End-Window, Transmission-Target X-Ray Tubes
    . a. Flux. One of the important parameters of an X-ray tube is the output flux. The output spectrum of. each tube is carefully measured with a Si PIN diode X-ray detector. Details of the experimental. setup and measurement approach have been presented elsewhere [3]. In the case of a thin film
  • Characterization Techniques for Miniature Low Power X-Ray Tubes
    , it is possible to achieve a very sensitive. current measurement while protecting the meter from high-voltage transients. Finally, the. filament impedance is monitored as an indicator of the tube vacuum integrity and/or the. tube high internal pressure. INTRODUCTION. Manufacture of X-ray tubes requires
  • High Resolution X-Ray Spectrometry
    The customer works on digitizing signals from a high-resolution x-ray spectrometer that is based on superconductors, rather than semiconductors. By applying a digital filter, they hope to determine the energy of the detected x-rays with accuracy of 1-in-500 to 1-in-1000, compared to less than
  • Miniature X-Ray Tubes Utilizing Carbon-Nano Tube Based Cold Cathodes
    The electron field-emission properties of carbon nanotubes enable the fabrication of cold. cathodes for a variety of vacuum device applications. The utilization of these cathodes is. an attractive alternative for the replacement of thermionic or hot cathodes for generating. X-rays. Miniature X-ray
  • X-ray Diffraction Residual Stress Techniques (.pdf)
    In x-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the crystal lattice. Although the term stress measurement has come into common usage, stress
  • Practical Application Of Nondestructive Residual Stress Measurements By X-ray Diffraction (.pdf)
    of these alloys. Results of the study show a nondestructive x-ray residual stress method providing measurements to depths of 0.0028 to 0.003 in. (51 to 76 ┬Ám) is not technically feasible.
  • Current Applications Of X-ray Diffraction Residual Stress Measurement (.pdf)
    A brief theoretical development of x-ray diffraction residual stress measurement is presented emphasizing practical engineering applications of the plane-stress model, which requires no external standard. Determination of the full stress tensor is briefly described, and alternate mechanical
  • X-ray Diffraction Characterization Of Residual Stresses Produced By Shot Peening (.pdf)
    A brief overview of the theory and practice of x-ray. diffraction residual stress measurement as applied to. shot peened materials is presented. The unique ability of x-ray diffraction methods to. determine both the macroscopic residual stress and the. depth and magnitude of the cold worked layer