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X Ray Fluorescence Spectrometer
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X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays.
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Supplier: Aurora InstrumentsDescription: The LUMINA 3300 Atomic Fluorescence Spectrometer provides elemental analysis solutions for sub trace detection of hydride-forming elements. The unique vapor generator provides enhanced sensitivities and reduced interferences for parts per trillion (ppt) detection of Mercury (Hg), Arsenic
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Supplier: Rigaku CorporationDescription: Winner of the 2007 R&D 100 award, a mark of excellence known to industry, government, and academia as proof that the winner is one of the most innovative products of the year, the Rigaku NANOHUNTER benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed
- Module Type: Wavelength Dispersive
- Detector Type: Other
- Optical System: Monochromator
- Excitation Source: X-Ray Tubes
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Supplier: Oxford Instruments / Industrial AnalysisDescription: The X-MET7000 is the cost-effective choice for routine quality control and quality assurance in many applications when determining elements in the Chorine (Cl) to Uranium (U) range. The X-MET7000 includes Oxford Instruments' X-ray tube and PIN-diode detector.
- Module Type: Energy Dispersive
- Detector Type: Other
- Excitation Source: X-Ray Tubes
- Analyzer Type: Single Channel
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Supplier: Bruker Nano Surfaces DivisionDescription: The M4 TORNADO is a tabletop µ-XRF spectrometer for the analysis of all kinds of samples, especially for non-homogenous or even samples with irregular shapes and rough surfaces. The large sample chamber accommodates a wide variety of sample sizes. The system can either be used in vacuum mode
- Detector Type: Other
- Excitation Source: X-Ray Tubes
- Sample Type: Solids, Liquids, Semi-solids
- Microscope: Yes
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Supplier: Rigaku CorporationDescription: kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable
- Module Type: Energy Dispersive
- Detector Type: Other
- Excitation Source: X-Ray Tubes
- Sample Type: Solids, Liquids
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Supplier: Rigaku CorporationDescription: Rigaku ZSX Primus delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of
- Module Type: Wavelength Dispersive
- Measurement Mode: Sequential
- Detector Type: Scintillation, Other
- Optical System: Crystal
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Supplier: MOXTEK, Inc.Description: The XPIN® detector is Moxtek’s best performing Si-PIN detector. XPIN detectors use a silicon PIN diode, multi-layer collimator, and thin DuraBeryllium® window, achieving great resolution and x-ray sensitivity. The XPIN preamp provides a low-noise signal output to an analog or digital
- Additional Output Options: Outputs an Analog Voltage
- Portable: Yes
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Description: •Trace analysis for consumer protection, e.g. lead content in toys
- Measurement Mode: Sequential
- Optical System: Other
- Excitation Source: X-Ray Tubes
- Sample Type: Solids, Liquids, Semi-solids
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Supplier: Rigaku CorporationDescription: The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Composition, Thickness - Film / Layer
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Supplier: Shimadzu Scientific Instruments, Inc.Description: Utilizing state-of-the-art technology, including enhanced local analysis technology, originally pioneered by Shimadzu in 1994, in conjunction with superb basic functions, the Lab Center XRF-1800 delivers exceptional reliability, stability, and sensitivity. With complete control, analysis and
- Spectrometer Type: X-ray Fluorescence Spectrometer
- Computer Interface: Yes
- Application Software Included: Yes
- Programmable: Yes
Featured Products for X Ray Fluorescence Spectrometer Top
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Oxford Instruments' launches a powerful, new, easy-to-use EDXRF spectrometer - designed for operation by anyone!. The innovative, high performance X-Supreme8000, is a compact, energy-dispersive. X-ray fluorescence (EDXRF) spectrometer for quality assurance and process control requirements across a diverse range of industries. Customized applications include: · Minerals and mining. · Petrochemicals - fuels/lubricating oils. · Wood pressure treatments. · Cement. · Food and cosmetics. · Plastics... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Oxford Instruments / Industrial Analysis -
The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness, film composition, and element concentration with new functions and a low-COO design. XRF tool for 200mm wafersA versatile and reliable tool for 200 mm and smaller wafers, the WDA-3650 incorporates our... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Rigaku Corporation
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protection function lets users set restrictions for screening conditions and other settings. The spectrometer also features an automatic X-ray tube aging function to prevent malfunction in systems that have not been used for long periods of time. (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Shimadzu Scientific Instruments, Inc.
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achieves high accuracy and good detection sensitivity. The XDAL 237 x-ray spectrometer has an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from aluminum (13) to uranium (92) simultaneously. Typical areas of application are: · Material analysis... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
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effective tool for materials analysis and coating thickness measurement. It is widely used for coating thickness measurement as well as element identification. The samples can be evaluated in almost any dimension and condition; powder, paste, liquid and solids are analyzed in the same manner. XRF gives fast results for WEEE and RoHS compliance testing. The FISCHERSCOPE® X-Ray series are energy dispersive high-performance x-ray fluorescence (EDXRF) spectrometers and provide simple, fast and accurate... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
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The new fX SEMTM custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting, allow very close coupling to the sample. The orientation yields high "flux" (x-rays) in small to large excitation areas on the sample surface. The fX SEMTM offers excitation areas 500µ to 25mm. The integrated high-voltage power supply operates up to a maximum power of 10 watts (35 kV and 0.1 mA depending on anode material). The close coupling provides XRF... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for IXRF Systems, Inc.
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With the new X-MET you can minimize the need for expensive and time consuming laboratory analysis. Use one X-MET for all your analysis, testing and screening needs: - Ore exploration and mine mapping. - On-site excavation control. - Grade control. - Process monitoring: concentrates, tailings etc. - Environmental control. X-ray fluorescence (XRF) analysis is a proven valued method of rapidly determining the presence of key minerals at mining sites worldwide. Its speed, flexibility and ease... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Oxford Instruments / Industrial Analysis
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at least 3% lead?. Ensuring a critical part contains at least 3% lead or other alloying elements can be accomplished with X-ray fluorescence measurement instruments. A quick, reliable, and non-destructive method for critical component identification for >3% lead has been developed by Fischer Technology. Using X-ray fluorescence combined with the state of the art WinFTM® Version 6 Software components can be clearly identified. By using this method, one can avoid the risks that might result should... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Fischer Technology, Inc. / Coating Thickness Gages
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The X-BeamTM custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting allow very close coupling to the sample. Patented polycapillary optics focus x-ray excitation down to sample areas as small as 10µ. The X-BeamTM is offered in 10µ and 40µ spot sizes. The close coupling provides XRF analytical results comparable to those from traditional "'tabletop" or "standalone" units. The X-BeamTM is designed so that it does not interfere... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for IXRF Systems, Inc.
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Designed for your environment. The X-MET7000 handheld dispersive X-ray fluorescence (EDXRF) analyser has been designed with your needs in mind. The X-MET7000's enhanced design provides total reliability, even in the harshest environments. The X-MET7000 has a genuine Oxford Instruments' miniature X-ray tube and high resolution, high count rate, built in PentaPIN® detector. This rugged and rapid multi-element analyser provides you with the exceptional level of analytical performance that Oxford... (read more)Browse X-Ray Fluorescence Spectrometers Datasheets for Oxford Instruments / Industrial Analysis
Conduct Research Top
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Comparison of Minimum Detection Limits on X-Calibur with SDD Detyector or Si-PIN Diode Detector (.pdf)
or. liquid from within a few minutes and can be the method of choice. Energy Dispersive X-ray. Fluorescence (EDXRF) spectrometers can play an important role in assuring that consistent quality of. samples are retained throughout a manufacturing process. SDD versus Si PIN diode detector. Xenemetrix
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Analysis of Heavy Metals in Aerosols on Air Filters (.pdf)
smelting operation. J. Environ. Monit. 2004; 6: 819-826. · Application of an energy dispersive x-ray fluorescence spectrometer to air pollution studies. M. Öblad, P Standzenieks, E Selin and J Dubois. Phys. Scr. 1982; 26: 257. Page 3. Applied Rigaku Technologies, Inc. 9825 Spectrum Drive, Bldg. 4
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What to Expect at Interphex 2007
particle size analyzers, Raman, fluorescence, pH meters, X-ray fluorescence, ellipsometers, elemental composition and materials characterization analyzers. ( International Portland manufactures 12 different models of class 100 downflow containment booths used for raw material sampling and dispensing
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Using VPD ICP-MS to monitor trace metals on unpatterned wafer surfaces
techniques, such as atomic absorption spectrometry (VPD-AAS), total reflection x-ray fluorescence (VPD-TXRF), and inductively coupled plasma mass spectrometry (VPD-ICP-MS). Sample preparation has traditionally been performed manually; this article presents results obtained from a semiautomated sampling
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Field-testing For Environmental Pollutants Using Briefcase Sized Portable LIBS System
) developed a portable LIBS system designed for a truly remote application;. profiling the surface of Mars. The LANL Martian Rover LIBS system is an alternative to. the x-ray fluorescence system used on the last two Mars missions. It was recently. discovered that the current Mars Rover's x-ray analysis
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Non-Destructive Analysis of Hazardous Substances in Electrical and Electronic Equipment
at critical locations (red areas). 20. Y / mm10. 0. 0. 10. 20. 30. 40. X / mm. ®. Quick, reliable, non-destructive measurements. Legal Regulations. distributes X-ray fluorescence instruments. content are required only if the limit value is. The EU Directives WEEE*, RoHS* and. for coating thickness
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MICRO: Ultrapure Fluids - Winters (April 2000)
), <100>, 150-mm, 100 200-cm test wafers were analyzed using three techniques: minority carrier lifetime (MCLT) analysis, vapor-phase decomposition total x-ray fluorescence (VPD-TXRF), and light-point defect (LPD) counting. To roughly estimate the performance of the filter without intensive analysis
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MICRO:Building Copperopolis, by Hugh Li, p.35 (March '99)
are commonly used to quantify particle contamination and other wafer surface defects, and total reflection x-ray fluorescence (TXRF) spectroscopy is used routinely for the analysis of metallic contamination. While the latter method provides relatively high sensitivity on blanket wafer surfaces, it requires
Engineering Web Search: X Ray Fluorescence Spectrometer Top
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Readout Categories - HORIBA
Energy Dispersive X-Ray Micro Analyzer Fluorescence Spectrometer Raman Spectrometer X-Ray Analytical Microscope
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Oxygen, Nitrogen, Hydrogen analyzer - HORIBA
Home » Scientific » Products » Elemental Analyzers » Oxygen/Nitrogen/Hydrogen » XGT-1000WR X-ray Fluorescence Analyzer
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X-Ray Fluorescence Spectrometers Information on GlobalSpec
X-ray fluorescence spectrometers measure the emitted X-ray fluorescence in either a simultaneous fashion, or sequential.
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New EDXRF Spectrometer - X-Supreme8000 from Oxford Instruments...
NEW X-MET7000 X-ray fluorescence analyser
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The Agency's Laboratories Seibersdorf and Vienna
X-Ray Fluorescence Spectrometer for Screening Environmental Samples X-Ray Fluorescence Spectrometer SEIBERSDORF
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X-ray astronomy detector - Wikipedia, the free encyclopedia
X-ray astronomy detectors are instruments that detect X-rays for use in the study of X-ray astronomy.
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NASA - NSSDC - Experiment - Details
The experiment consists of two instruments, the X-Ray Fluorescence Spectrometer and the Gamma Ray Spectrometer.
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Microscopy at UW-Madison | Research & service microscopy...
X-ray diffraction (4) Facilities Research facilities
