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  • MICRO: Product Extra!
    iC atomic force microscope (AFM) upgrade kit supports Veeco Dimension-series scanning probe microscopes, which accommodate large samples such as 300-mm wafers. The stage offers a scanning range of 100 X 100 um. The upgrade kit brings subnanometer accuracy and excellent scan linearity to existing
  • Medical Device Link .
    integrity. Standard features include a 75-mm x-ray detector, an 80-kV 5- um x-ray tube, z-axis movement of the x-ray tube, a joystick-controlled variable-speed x-y stage with a 75 sample rotation fixture, and an image-processing cpu with a 17-in. liquid-crystal display flat-panel monitor. Designed
  • MICRO: Products
    The Model 5200 PanelPrinter system performs advanced photolithography for large-area substrate applications that require 0.8 -4- um resolution. Fully integrated subsystems include a high-fidelity projection lens and illumination system, a precision x-y stage, an automated substrate-alignment system
  • MICRO:April 98:Product Technology News
    and to prepare the surface before photoresist application. The system can also be used as a quality control tool. Computerized measurement eliminates operator subjectivity that can cause misreads. The panel is placed on a large x-y stage and moved into the desired position. A computer-controlled droplet
  • Product Technology News
    at magnifications >20,000 x. A Windows-based interface makes the XL810 easy to use. (Semicon/West, San Francisco, South Hall, Booth 2715) An x-y stage is made specifically for use with 300-mm wafers. Preloaded air bearings and precision granite reference surfaces provide straightness and flatness

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