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  • VIVID 3D Digitizer and Underfill Testing of Cast Parts (.pdf)
    , a cross section must be displayed and checked at each axis (XYZ) or at a given angle. If the defective position can be specified for each part, displaying only a cross section rather than a contour can save time.
  • More Controllers, Fewer Cables
    and tend to outgas. * Separate control modules mounted directly to each axis can eliminate the problems associated with central controllers and motion-control cables. A relatively complex example comes from equipment for semiconductor wafer inspection. Typical systems contain a stack of XYZ linear stages
  • An Innovative Cabling Concept Improves Reliability for Multi-Axis Stage Systems
    up to 4 separate cables (with diameters of 8 to 14 mm). And up to 27 electrical wires must be connected. Wafer inspection systems in the semiconductor industry typically consist of a stack of XYZ linear stages plus a theta rotary unit. So there can easily be perhaps 16 connectors at the final

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