IC Probing Adapters and Analysis Adapters Information
Integrated circuit (IC) probing adapters and analysis adapters enable the testing of chips with an incompatible probe via an intermediary instrument. ICs are often tested during or after manufacture.
For testing integrated circuits there are many types of probes. A simple example probe is one used to measure voltage between two pins of an integrated circuit. A more complex system is a probe card that tests several pins or chips at once. Such probes are normally used during manufacturing.
The probe is typically connected to the device under test (DUT) and to the electronic testing unit, such as a voltmeter, an oscilloscope, or an ammeter. For each type of testing equipment there is usually a type of a probe that is incompatible.
Electrical test probes are commonly used with IC probing adapters.
A probe by itself cannot perform the testing operation on a chip without the help of a probing adapter. The adapter is an interface between the chip (form factor of the package) and the probe. By using different adapters the same probe can be used to test different form factors or footprints of IC chips, depending on the type of package. Adapters are classifed according to the package with which they interface, including:
Quad flat pack (QFP) or plastic quad flat pack (PQFP)
Plastic leadless chip carrier (PLCC)
Small outline itegrated circuit (SOIC)