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Inspection Tools and Instruments
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Surface Profilometers
>
New York
> Poughkeepsie
Surface Profilometers Suppliers in Poughkeepsie, New York
Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
(more)
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Find Surface Profilometers by Specification:
Technology:
Contact / Stylus Based
Non-contact - Optical / Laser
Other
Surface Metrology:
2D / Line Profile
3D / Areal Topography
Measurement Capability:
Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
Spacing Parameters (P
C
, S
m
)
Waviness Parameters (W
a
,W
t
)
Hybrid Parameters
Defects / ADC
Common Specific Parameters:
Roughness Average (Ra)
Roughness - RMS (Rq)
Mean Peak to Valley Height (Rtm, Rz)
Base Roughness Depth (R3Z)
Maximum Peak Height (RP)
More Specifications >>
Showing Suppliers 1 - 1 of 1
Dorsey Metrology International, Inc.
Address:
53 Oakley Street, Poughkeepsie, NY
Business Type:
Manufacturer, Service
Show All Surface Profilometers Suppliers in New York
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