Wafer and Thin Film Instrumentation Suppliers in Corvallis, Oregon

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
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Precision Measurements and Instruments Corp.
Address:  3665 SW Deschutes St., Corvallis, OR
Business Type:  Service
Description:  Precision Measurements and Instruments Corp. was founded in 1991 in Philomath, Oregon by Dr. Ernest G. Wolff, providing highly accurate thermal expansion measurements using the Michelson laser interferometry. As the importance of understanding thermal expansion characterization of materials... (more)