Wafer and Thin Film Instrumentation Suppliers in Tennessee

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Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.

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Dynamic Structures & Materials, LLC

Address: 205 Williamson Square, Franklin, TN

Business Type: Manufacturer

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