Semiconductor Metrology Instruments Suppliers in Nebraska

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
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J.A. Woollam Co., Inc.
Address:  645 M Street, Suite 102, Lincoln, NE
Business Type:  Manufacturer