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Semiconductor Metrology Instruments Suppliers in New Jersey
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
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Showing Suppliers 1 - 4 of 4
  Angstrom Scientific, Inc.
Address:  PO Box 663, Ramsey, NJ
Business Type:  Distributor
  ECI Technology, Inc.
Address:  60 Gordon Dr., Totowa, NJ
Business Type:  Manufacturer
  Moser Company
Address:  518 State Route 57, Phillipsburg, NJ
Business Type:  Manufacturer, Service
  Rudolph Technologies, Inc.
Address:  One Rudolph Road PO Box 1000, Flanders, NJ
Business Type:  Manufacturer

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