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Semiconductor Metrology Instruments Suppliers in Texas
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
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Showing Suppliers 1 - 4 of 4
  Xenemetrix Inc. (Formerly Jordan Valley AR Inc.) (5 Products)
Address:  8601 Cross Park Drive Suite 200, Austin, TX
Business Type:  Manufacturer
  GOEPEL Electronics LLC
Address:  9600 Great Hills Trail, Suite 150 W, Austin, TX
Business Type:  Manufacturer
  Jordan Valley Semiconductors, Inc.
Address:  8601 Cross Park Drive, Suite 200, Austin, TX
Business Type:  Manufacturer
  Nano-Master, Inc.
Address:  3019 Alvin Devane Boulevard, Suite 300, Austin, TX
Business Type:  Manufacturer, Distributor

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