Semiconductor & MEMS Fabrication News

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Description: GlobalSpec's Semiconductor & MEMS Fabrication free eNewsletter focuses on silicon-based technologies and manufacturing processes. This free email publication keeps subscribers up-to-date on the latest devices, manufacturing techniques, and applications to improve silicon-based product design, production, and testing. Product news covers microelectronic and optoelectronic devices (transistors, photo detectors, and solar cells) as well as fabrication techniques used in making chip-size motors, actuators, and other micro electrical mechanical systems.
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Industry Trends & Events . . .
Wanted: EDA Tools for Designing ICs

Wanted:  EDA Tools for Designing ICs As devices become more complex, designing them so that they work as intended presents a considerable challenge. The availability of design automation tools capable of handling the load has proved spotty, at best. This analyst predicts that the EDA market will grow to a $6.6 billion industry by 2015 — but only if the tools provide effective design solutions at reasonable cost. At issue is not the price of the software itself, referred to as "lunch money" by an attendee at the Design Automation Conference. Instead, he cites examples such as device manufacturers' need to develop systems-on-chip (SoC) for less than $25 million.

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1-axis and 2-axis Analog Gyroscopes
Digi-Key Corporation

1-axis and 2-axis Analog Gyroscopes STMicroelectronics' complete family of 1-axis (yaw) and 2-axis (pitch-and-roll, pitch-and-yaw) MEMS gyroscopes offers the industry's widest full-scale range: 30 dps to 6000 dps (degrees per second). Sensors provide two separate outputs at the same time: an unamplified output value and a 4x amplification to enhance design flexibility and user experience.

Metal Liftoff and Stripping Batch Tool
JST Manufacturing, Inc.

Metal Liftoff and Stripping Batch Tool JST's Metal Liftoff batch Tool is a multi-tasking tool utilizing JST's downflow spray under immersion technology to enhance the process. Metals are removed form the wafers and then the bath so they don't redeposit on the wafer. The process is followed by solvent or water rinse and JST's IPA Vapor Dryer.

How Clean are Your Elastomer Seals?

Precision Polymer Engineering Ltd.

How Clean are Your Elastomer Seals?  As feature sizes become even smaller, high purity elastomer seals are essential to reduce particle contamination and wafer defects. The latest generation of Perlast® and Kimura® elastomer materials utilize self reinforcing technology to eliminate fillers, providing the highest levels of purity and performance. Innovative compounds, Higher Yields. Pure Genius.

Cable Solutions for the Semiconductor
Industry

Leoni Elocab Ltd.

Cable Solutions for the Semiconductor Industry LEONI's Flexible Sleeve Technology (FST) allows for rapid prototyping, any arrangement of components, and flex life exceeding 10 million cycles.

Assembled prototypes can be delivered within two weeks from time of order

To view our Flexible Sleeve Technology product, follow this link, or visit our online profile for more information.

Digital Article . . .
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Get a Complimentary Article from the IEEE Xplore® Digital Library
IEEE — Institute of Electrical and Electronics Engineers, Inc.

Get a Complimentary Article from the IEEE Xplore® Digital Library  The IEEE Xplore Digital Library provides instant, full-text access to all IEEE journal articles, conference papers, and standards — all the cutting-edge research in all aspects of technology. Get a complimentary semiconductor article today.

Design . . .
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Another Approach to Moore's Law

Another Approach to Moore's Law Moore's Law promises functional semiconductor advances based only on the number of transistors can squeeze into a particular space. But according to this article, justifying the cost of building those devices will demand increasing wafer size from 300 to 450 mm to reduce the cost per die. The author cautions, however, that the migration must proceed more smoothly than did the previous one from 200 to 300 mm.

Keeping the Heat Down

Keeping the Heat Down Shrinking feature sizes — along with ever-smaller packages for the same size silicon — complicate the task of device cooling. This item outlines some techniques that can help keep your devices from getting too hot. They include determining the die's electrical and thermal capacity, understanding the package's thermal characteristics, and using current pulses to reduce device duty cycles.

Materials. . .
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Move Over, Silicon — Here Comes Graphene

Move Over, Silicon — Here Comes Graphene One of the hottest topics among semiconductor manufacturers today is finding a material successor to silicon for next-generation devices. Industry pundits have touted numerous alternatives that show varying degrees of promise. IBM recently joined the fray, developing transistors from the nanomaterial graphene. Although these are not the first transistors made of graphene, the latest work connects the graphene transistors to conventional components.

Phabrication Without Photomasks

Phabrication Without Photomasks Conventional semiconductor fabrication techniques — involving photoresist patterning with a photomask and an expensive vacuum chamber — is both inflexible and difficult to adapt to nano-scale electronics. Now, a researcher at the Korea Advanced Institute of Science and Technology has developed a high-resolution alternative for direct metal patterning that sinters particles with a femtosecond laser. He contends that his approach will prove far less expensive than electron-beam lithography.

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Heating Jackets and Controls
Glas-Col, LLC

Heating Jackets and Controls Glas-Col heating jackets, designed to achieve temperatures up to 250 C, help reduce buildup in forelines, exhaust lines, and pump lines. In turn, this reduces the risk of damaged products and equipment. A full line of temperature control packages are also available.

Custom Touchscreen Solutions
PANJIT SemiConductor

Custom Touchscreen Solutions PanJit offers the broadest range of customization solutions to meet your next project specifications. Our NRE fees are the lowest in the industry. Combined with our short design cycles and customization offerings, we can meet project requirements in a timely basis. Review customization items for touchscreens.

Test & Measurement . . .
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Earlier Detection of Laser Diode Optical
Losses

Earlier Detection of Laser Diode Optical Losses Recognizing that finding defects earlier in a manufacturing process reduces test time and cost, Corning has demonstrated a technique for determining waveguide losses in laser-diode wafers even before constructing the varied-length laser cavities required by traditional test methods. The information obtained can help guide materials choices and process modifications to minimize future losses.

Facing the Challenge of Testing TSVs
 

Facing the Challenge of Testing TSVs Multiple-die chips and other package-saving technologies have introduced through-silicon vias (TSVs) to carry the signals from one layer to another. This inspection system specifically looks for defects in the vias, providing a new capability for device manufacturers. It can also examine device bump metrology and can flip wafers to inspect both sides.

Applications & Commercialization . . .
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What Drives an IC's Cost?

What Drives an IC's Cost? The cost of an IC to the customer no longer depends only on die size. Factors such as the manufacturing process, customers' need for tight compliance to specifications, test time and effectiveness, and vendor reputation factor in as well. Defending his company's premium pricing, one vendor points out that he could sell his products for much less if he didn't have to guarantee their specs.

Will the Device Perform in Your Application?

Will the Device Perform in Your Application? You are designing a product that requires a high-performance operational amplifier. Knowing the device's specifications is not enough. You also have to determine how it will interact with the other components in your design. This video introduces a input-offset evaluation board for one company's 50 MHz CMOS op-amp that can provide the answers.

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Titanate Nano Powders (Barium, Strontium
Titanate)

TPL, Inc.

Titanate Nano Powders (Barium, Strontium Titanate) TPL offers a range of titanate powders with controlled size and chemistry. NanOxide™ powders are produced via an aqueous, low temperature process that allows for binary and tertiary oxide compositions with controlled stoichiometries. The crystalline ceramic powders have uniform spherical morphology and high dielectric constant with sintering temperatures as low as 1000 C.

Hexoloy® SG Silicon Carbide

Saint-Gobain Ceramics — Hexoloy® Products

Hexoloy® SG Silicon Carbide Hexoloy® SG Silicon Carbide is a unique electrically conductive analog of sintered silicon carbide that can be readily DC magnetron sputtered. Hexoloy® SG features high-density and uniform electrical resistivity, less than 5 ohm-cm. It can be sputtered at high deposition rates compared to other ceramic target sources, with controllable thin film optical properties.

Careers & Commentary . . .
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Semitracks Online and Public Training
Courses

Semitracks Inc.

Semitracks Online and Public Training Courses We specialize in training for Failure Analysis, Semiconductor Reliability and Packaging, and related semiconductor topics. Educating engineers and managers alike. Sign up now!

Stressed Out?

 

Stressed Out?  Are you feeling overwhelmed by job stresses that never seem to go away? You're certainly not alone. This column describes the high-stress environment in today's workplace, examining its sources and how to manage it. The author suggests that a modicum of stress helps you perform at your peak. Higher levels, however, are neither healthy nor productive.

Diversions . . .
But Pi Are Round!

But Pi Are Round! On March 14 every year, people celebrate "Pi Day" to honor pi — 3.14. Now, however, it has competition. June 28 saw a celebration of "Tau Day" — where tau is 2 times pi (6.28). Its proponents contend that although pi is the ratio of the circumference of a circle to its diameter, most mathematical expressions rely on radius rather than diameter. The radius of a circle is half the diameter, so the ratio of the circumference to the radius is tau.

Share Your Thoughts . . .
About This Month's Topic

About This Month's Topic How Do You Manage On-the-Job Stress?

What kinds of stresses do you encounter at work? Are you under constant stress, or does it wax and wane? How and why? How often do you feel that stress will overwhelm you?


Join the discussion...


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July 13, 2011 - Volume 3 Issue 7
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Archives
Past Issues of this eNewsletter
Volume 5 - Issue 5 - 05/08/2013
Microcircuit Materials - Large Batch Electronics Grade; Tiny MEMS Pressure/Vacuum Sensor Coming Soon!; Companies Worldwide Taking Advantage of the Accumeasure Systems; Titanate Nano Powders (Barium, Strontium Titanate); Bellows Pumps and Compressors; Hexoloy SG Silicon Carbide
Volume 5 - Issue 4 - 04/10/2013
New Capacitive Measurement Catalog; Wire and Electrode Feedthroughs for Photovoltaic Industry; New Xtrinsic Accelerometers; Apiezon Launches PFPE High Temperature Lubricating Vacuum Grease; New IQ+ Vacuum Pressure Control Valves; Purely Sealing Your Success; PRIME MOVER Hermetic Bellows Linear Actuators; Integrate Micro-imaging Quickly and Easily; Nano-precision Positioners/Aligners Up to Six Axes; Surface Mount Fuses with 72 V Interrupt Rating
Volume 5 - Issue 3 - 03/13/2013
New Three-axis Digital MEMS Gyroscope; Leading-edge Precious Metal Processes for Semiconductors; Purely Sealing Your Success; Analog ASICs Copy-protected by Process; Keep an Eye on Wafer Thickness; Compact Vortex Meters for Flow, Temperature, and Pressure Measurement; Prime Mover Hermetic Bellows Linear Actuators
Volume 5 - Issue 2 - 02/13/2013
LIC 4000 Encoder - Absolute position values to 1 nm; New Sensor for Wafer Thickness; High Performance MEMS G100Z Gyro - Ultra Low Noise; We've Gone 2D!; PRIME MOVER Hermetic Bellows Linear Actuators; Precision CNC and Conventional Custom Mfg.
Volume 5 - Issue 1 - 01/09/2013
Piezo Motors Nanometer-scale Precision; confocalDT Distance/Thickness Spectrometer; Thermocouples for ASM Epsilon Reactors; Large Industrial Transformers for Alternative Energy; Vacuum Chamber Experts; Transfer Valve/Insert/Door FlapVAT; Purely Sealing Your Success; Bellows Pumps and Compressors; Measure Vibration, Ultrasound, and Temperature Simultaneously; 40 Years of Quality Printed Circuit Boards
Volume 4 - Issue 12 - 12/12/2012
Oil-less Rocking Piston Lab Compressor; Wafer Cleaning - Etch, Strip, Clean, In Control.; Avoiding Semiconductor Failures; Custom Chemical Synthesis ; Rugged Ultra Low Noise Dual Axis Gyro - G200
Volume 4 - Issue 11 - 11/14/2012
STMicroelectronics L3G4200D Gyroscopes; TLC5929: 16-Ch Constant Current LED Driver; Semiconductor Leaders Reduce Processing Costs; Custom Bearings
Volume 4 - Issue 10 - 10/10/2012
New Ultra-versatile Micro Imaging Lens System ; AMOLED and MEMS Device Manufacturing; Precious Metal Plating for Semiconductor Applications; Thermocouples for ASM Epsilon Reactors; New IQ+ Vacuum Pressure Control Valves; PolySim: An ESD-Resistant Enclosure Curtain; Medical Metal Parts in as Little as Two Days!; NASA Low Outgassing Approved, UV Curable Epoxy; Logistics Helps Predict the Future of High-tech Supply Chains
Volume 4 - Issue 9 - 09/12/2012
Advanced MEMS Microphones; Fully Automated Wafer Wet Bench; Precision Analog IMU - MRM30 IMU; High-sensitivity Magnetic Field Sensor; Chillers for Semiconductor Equipment Cooling
Volume 4 - Issue 8 - 08/08/2012
The Next Level of Precision Adjustment; Compact Vortex Meters for Flow, Temperature, and Pressure Measurement; Manual and Pneumatic Ball Valves; Zero Power Millimeter Sensors Using EnerChips;
Volume 4 - Issue 7 - 07/11/2012
Motorized Precision Positioners for High Vacuum /EUV; Epoxy Offers Shock and Impact Resistance; STT-MRAM Metrology Tool for 300 mm Wafers; New Zooming Single-objective Probing Microscope; Modular Cleanrooms Mean Profits; Low Noise G50Z-LN High Performance MEMS Gyro
Volume 4 - Issue 6 - 06/13/2012
Flexible Designs Boost Customer Productivity!; Ultra-high Purity Pump for Semiconductor Manufacturing; Compact Vortex Meters for Flow, Temperature, and Pressure Measurement; Extend the Life of Your Wet Bench; Chemcassette Paper Tape: The Reel Deal; New Trap for MOCVD; Semiconductor LPCVD Silicon Nitride Film; New Magnetic Angle Sensors by MultiDimension; Low Noise G50Z-LN High Performance MEMS Gyro
Volume 4 - Issue 5 - 05/09/2012
New STM32 F4 Series; Get Control of Your Batch Making!; Stop Over Greasing Bearings; HEMP/EMP Filters
Volume 4 - Issue 4 - 04/11/2012
Miniaturized Positioning Stages Offer Micron-level Accuracy; confocalDT High End Spectrometer; Breakthrough Hyper-pure Silicon Finishing; Increase Heat Sink Cooling Efficiency; Wire and Electrode Feedthroughs for Photovoltaic Industry; Compact Vortex Meters for Flow, Temperature, and Pressure Measurement; SMT Rework Stations and Inspection Systems
Volume 4 - Issue 3 - 03/14/2012
Profile Thermocouples and Spike Thermocouples for Furnaces; Increase Heat Sink Cooling Efficiency; Aluminum Vacuum Chambers; Ultra Pure Rubber Seals; 200/300 mm Fully Automated Process Station; Leading Edge E-beam Technology Solutions Provider; Offshore and Domestic PCB Manufacturing at Any Volume;
Volume 4 - Issue 2 - 02/08/2012
Micromotors Speed Up PCB Assembly; M2M Application Platform Perfected; 3-axis Light Source Holder Machining Services; Air Conditioning/Refrigeration Compressors and Pressure Vessels; OLED Takes FPD to New Level; Miniature Linear Scale for Tight Spaces; Electrically Insulative Snap Cure Epoxy; New Magnetic Switches Feature High-speed, Low-power
Volume 4 - Issue 1 - 01/11/2012
New Capacitive Measurement Catalog; Reduced Footprint Batch Wafer Wet Bench; New Gamma Detector; Semiconductor Imaging Solutions; New IQ+ Vacuum Pressure Control Valves; SMT Rework Stations and Inspection Systems
Volume 3 - Issue 12 - 12/14/2011
Where Applications Demand Optimum Surface Finish; Single-element Silicon PIN Photodiodes; Extend the Life of your Wet Processing Systems; New Cryopump Remanufacturing Facility; Semiconductor LPCVD Silicon Nitride Film; CMC Offers Toll Milling
Volume 3 - Issue 11 - 11/09/2011
2SMPP MEMS Gauge Pressure Sensors; NexGen Film Frame Probers; Optimal Surface Quality During Bulk Reduction; Tightly Controlled Batch Wet Processing; Miniature Linear Scale for Tight Spaces; Semitracks Online and Public Training Courses; Vacuum Chamber Experts; Manual Wet Process and Support Tools; Semiconductor LPCVD Silicon Nitride Film
Volume 3 - Issue 10 - 10/12/2011
Using Induction Heating for Crystal Growing; Complete Automated Wet Process Solutions; Point and Shoot Microscopy; SANYO Motor Driver ICs Available; New Ultra-high Performance Multi-axis Gyro Module; Electroglas PCB Repair and Amp Service; Combined Gas Source and Distribution System; Dragline Bucket Wear Parts; Quick Curing Chemically Resistant Epoxy;
Volume 3 - Issue 9 - 09/14/2011
ADXL345 Digital iMEMS Motion Sensors; Mass Imaging Makes Semi Manufacture More Productive; Industry Leading Four to Six Week Lead Time; Automated Wet Process Systems, Fume Hoods; CLA LED Illumination Bars; Dual-in-Line Sockets RA Mounts; An ASIC Solves Your Design Challenges; Powders into Liquids
Volume 3 - Issue 8 - 08/10/2011
Point and Shoot Microscopy; Rapid Curing for Heat Sensitive Materials; Transfer Valve/Insert/Door FlapVAT; Caged Ball LM Guide Type RSR and SRS7; Semiconductor Passivation and Electropolishing
Volume 3 - Issue 7 - 07/13/2011
1-axis and 2-axis Analog Gyroscopes; Metal Liftoff and Stripping Batch Tool; How Clean Are Your Elastomer Seals?; Cable Solutions for the Semiconductor Industry; Heating Jackets and Controls; Custom Touchscreen Solutions; Titanate Nano Powders (Barium, Strontium Titanate); Hexoloy SG Silicon Carbide
Volume 3 - Issue 6 - 06/08/2011
DI Water/Nitrogen Heater and Pure Steam Generators; Buying Refurbished Equipment Yields a Greater ROI; Brush Engineered Materials Companies Are Now Materion; Extend the Life of your Wet Processing Systems; New Ultra Low Outgassing Lubricants; Non-contact Thickness Measurements; EnerChip CC with Integrated Battery Management; Etched Foil Heaters - Semiconductor and Wafers
Volume 3 - Issue 5 - 05/11/2011
1-axis and 2-axis Analog Gyroscopes; Buying Refurbished Equipment Yields a Greater ROI; RF MEMS Switch; Thickness Made Easy; Infrared Microscopev; 3-axis Light Source Holder Machining Services; Low Noise G50Z-LN High Performance MEMS Gyro; Three-Channel Signal Conditioner; Wafer Carriers in Sapphire
Volume 3 - Issue 4 - 04/13/2011
Confocal Displacement Sensor; Reduced Footprint Batch Wafer Wet Bench; Surface Metrology Performance and Value; Crystal Growing: Ambrell Induction Heating Solutions; Buying Refurbished Equipment Yields a Greater ROI; Chemical Resistant Seals; Ammonia Scrubbing in Semiconductor Manufacturing; Diffractive Optics, Micro-optics, Photonics
Volume 3 - Issue 3 - 03/09/2011
Profile and Spike Thermocouples for Furnaces; Unique Pressure sensor for Battery and Wireless Operation; Titanate Nano Powders (Barium, Strontium Titanate); Semiconductor and AMHS Installation and Maintenance Services; Ultra Low-power ADXL345 Three-axis iMEMS Digital Accelerometer; EnerChip CC with Integrated Battery Management
Volume 3 - Issue 2 - 02/09/2011
Wafer and Substrate Clean Drying; Dedicated Mask Aligner Solutions for HB-LEDs; Surface Metrology Performance and Value; Low Noise G50Z-LN High Performance MEMS Gyro; Passivation and Electropolishing for the Semiconductor Industry; Buying Refurbished Equipment Yeilds a Greater ROI; UniCond Sensors with Ultra-wide Range and Accuracy; Flexible, Thermally Conductive Epoxy; Heater and Thermal Sensors-Heaters with Sensors
Volume 3 - Issue 1 - 01/12/2011
Revolutionary Eddy Current Technology; Spin Rinse Dryers - New; High Throughput, Low-cost, Wet Processing Sytems; Dedicated Mask Aligner Solutions for HB-LEDs; The Economical Answer to Wafer Metrology; New M800 Multiparameter Transmitter With Predictive Diagnostics; Motor Insulation for Flexibility, Durability, and Stability; Diffractive Optics, Micro-optics, Photonics; RF MEMS Switch
Volume 2 - Issue 12 - 12/08/2010
Continuous Monitoring System Pays for Itself in One Year; High-temperature Memory for Harsh Environments; Affordable Wafer Shape and Thickness Tools; We Solve Your Sub-micron MEMS Automation Challenges
Volume 2 - Issue 11 - 11/10/2010
Continuous Monitoring System Pays for Itself in One Year; Profile and Spike Thermocouples for Furnaces; Low Noise G50Z-LN High Performance MEMS Gyro; IPA Dryer - Surface Tension Gradient; Three-channel Signal Conditioner; Cost-effective Production for Analog ASICs; Improved Crystal Growth with Induction Heating
Volume 2 - Issue 10 - 10/13/2010
32-bit Power Architecture Microcontrollers from Freescale; Precision Machined Components for the Semiconductor Industry; Pure Processes, Safer Solutions; Chart Recorder Replacement ROI in 1-year; Industrial Femtosecond Lasers for Micromachining; PURA High Purity Gas Dewpoint Transmitter; UniCond Sensors with Ultra-wide Range and Accuracy; MEMS Module; Multiple Automation Platforms to Meet Your Needs; RF MEMS Switch
Volume 2 - Issue 9 - 09/08/2010
TI's CSD86350Q5D Synchronous Buck NexFET Power Block; Solve Your Microelectronics Failure Analysis Challenges; Profile and Spike Thermocouples for Furnaces; Heater and Thermal Sensors-Heaters with Sensors; New Sensor for Wafer Thickness; Wafer Carriers in Sapphire; JPE Needle Valve; Vacuum Wet Process Equipment for MEMS Manufacturing
Volume 2 - Issue 8 - 08/11/2010
Compact Thermo Chiller; In-Motion Solution; OX400 Low Oxygen Concentration Analyzer; MEMS Gyro Sensors Replacing FOGs; Diffractive Optics, Micro-optics, Photonics; New Energy Efficient Tool; Low Noise G50Z-LN High Performance MEMS Gyro
Volume 2 - Issue 7 - 07/14/2010
Calcium Fluoride (CaF2) Single Crystal; Wire and Electrode Feedthroughs for Photovoltaic Industry; 5000TOCe Smart TOC Sensor; Three-Channel Signal Conditioner; New State-of-the-Art Cooling Technology ; MIL-STD Thermal Shock Environmental Test Chambers
Volume 2 - Issue 6 - 06/09/2010
Thermocouples for ASM Epsilon Reactors; Mega ION; Laser Technology For Semiconductor Applications; RF MEMS Switch; High-speed Type SKR Actuator; JPE Ball Valve; New Sensor for Wafer Thickness
Volume 2 - Issue 5 - 05/12/2010
Microchip's PIC32 32-Bit MCU; Leading the Metal Sealing Industry; New State of the Art Cooling Technology; We Solve Your Sub-micron MEMS Automation Challenges; Don't Miss Microtech 2010 - June 21-24 - Anaheim, CA; Low Noise G50Z-LN High Performance MEMS Gyro; NEW Actuator Type GL-N; Chemical Dispense/Waste Cabinets; JPE Tube Fitting
Volume 2 - Issue 4 - 04/14/2010
Inline Metrology with the XE-3DM; Mass Imaging Makes Semi Manufacture More Productive; New Cool-ORing Active ORing Solutions; New Thermal Insulation Increases Heater Efficiency; An ASIC Resolves Your Design Challenges; World's 1st Combination Cleaner and Cleanliness Tester; Linear Technology's Ultra-tiny ADCs
Volume 2 - Issue 3 - 03/10/2010
World's 1st Combination Cleaner and Cleanliness Tester; We Make the Labyrinth Seal Specifically for You; Inline Metrology with the XE-3DM; Gyro Sensor with Low In-run bias Stability; New Accelerometer Sensors for User Interfaces; Gas Handling Systems for Semiconductor Production; Single Wafer Spray Module; Analog Devices' ADA4501 Operational Amplifiers; Thin Film - RC/RCD
Volume 2 - Issue 2 - 02/10/2010
Complete Thermal Solutions for Semiconductor Processing; Vapor Flow Control without MFCs; Analog Devices' ADXL345 MEMs Accelerometer; Thin-section Bearings: Precision with Space Savings; Reduce Pricing Pressures and Gain Global Operational Visibility; Extend the Life of your Wet Process Systems; Prototype Electronic Assembly Services; SMT Rework Stations and Inspection Systems
Volume 2 - Issue 1 - 01/13/2010
Global High Tech Summit, Feb 11/San Jose; Gain Global Operational Visibility and Reduce Pricing Pressures; Polysilicon Wafer, Ingot, and Chunk Cleaning; Understanding the Fundamental Conductivity and Resistivity of Pure Water; In-Motion Solution; Complete Device Fabrication Available; Communications Custom Cable Molding
Volume 1 - Issue 4 - 12/09/2009
MEMS Gyro Sensors Replacing FOGs; PoP Paste Indium9.88-HF; Automated, Precise, Efficient; Low Noise G50Z-LN High Performance MEMS Gyro; MEMS Foundry Leadership; RF MEMS Switch; STMicroelectronics' MEMS Gyroscopes; Thin Film - RC/RCD
Volume 1 - Issue 3 - 11/11/2009
PoP Paste Indium9.88-HF; Extend the Life of Your Wet Process Systems; Bringing Answers to the Surface; Reduce Pricing Pressures While Increasing Visibility into Global Operations; MEMS Device Fabrication; High Temperature Acoustic Measurement System; Thin Film and Silicon Wafer Supplier; Sensors for Modal Analysis Testing
Volume 1 - Issue 2 - 10/14/2009
Bringing Answers to the Surface; Vapor Flow Control without MFCs; Low Cost, High Efficiency Actuator Type VLA; Analog Devices' ADXL345 MEMS Accelerometer; Thin Film and Silicon Wafer Supplier; Cost-effective Automation; Semi-Gas Centurion Gas Cabinet
Volume 1 - Issue 1 - 09/09/2009
Low Noise G50Z-LN High Performance MEMS Gyro; Vacuum Solutions for Semiconductor Applications; High-speed Type SKR Actuator; Semiconductor Thickness - CHRocodile IT; Don't Settle - Choose Superior RF/MMIC Technologies; Film Laminations with Optical Films