What can we expect in automated electronics test in this troubled year? What trends will continue, and which will be derailed by other "economic" considerations? This overview from the National Instruments Web site looks at the current trends that demand efficient test and presents the author's assessment. It suggests that we can expect more software-based instrumentation and more parallel testing to reduce costs. Certain areas will continue to grow. Wireless testing and protocol testing will expand despite budgetary challenges. Interested readers can also access case studies and other support material directly from the article.

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Testing the equipment that carries information transfers has become more difficult. Factors such as jitter are suddenly center stage. Comprehensive testing using a bit-error-rate tester (BERT) is excruciatingly slow. This article describes a software-based approach that takes advantage of an instrument you already own.

Rapid migration to broadband communication complicates testing the infrastructure required to carry or process it. Signals once measured reliably by a spectrum analyzer now defy the simple approach. This High Frequency Electronics article traces the evolution of broadband signals, describes the accompanying test challenges, and offers practical solutions.

The adoption of boundary scan standard IEEE 1149.1 offers a window into the internal workings of boards and systems. It addressed many situations, yet some designs reside outside its venue. This item in Test & Measurement World describes extending the standard to encompass more of the daily test challenges facing engineers.

Electro-optical systems require extremely precise measurement to ensure proper system function and that the optical components are aimed correctly. Normal system operation may include multiple focal paths and wavelengths and other complications. This article describes practical techniques to reduce measurement time and cost.

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The increasing functionality of electronic components and budgetary constraints are changing vision system demands. Companies including inspection in their test strategies are demanding more of their inspection systems. The vision systems must have more capability and must withstand the bumps and grinds of daily operation.

The relationship between automated optical and X-ray inspection remains dynamic as circuits under inspection have evolved. Numerous articles have suggested where to draw the line, but movement is continuous. This article offers an opportunity to assess the current status of two techniques and tells how to use them to advantage.

The death of in-circuit testing has been greatly exaggerated. While many test engineers would like to escape its challenges, it still finds defects in boards that can easily elude other techniques. This piece from Circuits Assembly describes some practical approaches for taking the best advantage of this time-honored tool.

An old adage in the test industry maintains that your test equipment will always remain one generation behind the devices, boards, and systems that it is required to test. Even more current today, this piece addresses the challenges that multiple-input/multiple-output devices present to device testers that must ensure they work.

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