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2.1 BURN-IN DEFINITIONS
In MIL-STD-883C [1], Method 1015.3, "Burn-in Test," burn-in is defined as follows:
Burn-in is a test performed for the purpose of screening or eliminating marginal...
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As is true throughout the electronics industry, the terms used to define or describe a discipline can vary widely. In understanding ESS, there are a number of critical areas where these variations may...
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15.1 INTRODUCTION
Thermal analysis includes a group of techniques in which specific physical properties of a material are measured as a function of temperature. The techniques include the...
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Qualification Test Results
Following the final alignment and test the filters were subjected to two non-operational thermal cycles consisting of temperature plateaus of ?40 and +85 degrees Celsius.
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4.1 FLAW-STIMULUS RELATIONSHIPS
Before discussing the flaw-stimulus relationships, two defect definitions need to be clarified, namely, patent defect and latent defect.
A patent defect is a flaw...
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