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Thin Film Analysis- Techniques & Methods

From Balazs Analytical Services
 

 

Thin film analysis continues to play an important role in semiconductor, photovoltaic, disk drive and other high-tech manufacturing. From surface morphology to high resolution depth profiling, manufacturers require analytical data to evaluate their process and modify processes to improve yield, reduce contamination and increase the success of their devices. BalazsTM offers a complete range of thin film analytical services that characterize materials and films through a wide range of techniques.

Products & Services
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn more about Wafer and Thin Film Instrumentation
Thin film circuits and thin film products are metallized or plated onto ceramic substrates. Learn more about Thin Film Circuits and Products
Thin film process monitors are used to control thin film deposition rate or composition during processing. Learn more about Thin Film Process Monitors
Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation. Search by Specification | Learn more about Thin Film Equipment
Thin film materials are high purity materials and chemicals such as precursor gases, sputtering targets or evaporation filaments used to form or modify thin film deposits and substrates. Learn more about Thin Film Materials
Product Announcements
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Victrex plc. - Victrex APTIV PEEK™ films for RFID Tags
With the increasing success & popularity of RFID technology more demands are being placed on its performance. APTIV film's unique combination of properties like high temperature performance,... (read more)
Associated Polymer Labs, Inc. - FTIR Profiles for Polymer Characterization
FTIR (Fourier Transform Infrared Spectroscopy) identifies and characterize the materials that are used in manufacturing. Associated Polymer Labs, Inc. provides this testing to screen polymer and... (read more)
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical... (read more)
Veeco Instruments - Dektak 8
Advanced stylus profiler system delivers high repeatability, low-force sensor technology and advanced 3D data analysis for surface characterization of MEMS and thin & thick films. (read more)
 
Topics of Interest
Analytical examination of failed joints can sometimes lead to an explanation of why the specimen failed. Analysis of the adhesive generally consists of characterizing the cured film, curing agents,... (Read More)
Overview Three aspects of grain structure affect properties of thin films: crystallographic texture, grain morphology, and grain size. For example, control of thin film magnetic properties requires... (Read More)
7.3 Case Studies Very different techniques are used to investigate the magnetic microstructures in ferromagnets. All of these techniques have their strengths and drawbacks that make them best suited... (Read More)
Adrian B. Mann Summary Instrumentation for the testing of mechanical properties on the submicron scale has developed enormously in recent years. This has enabled the mechanical behavior of... (Read More)
Michael Farle [*] 1. INTRODUCTION Magnetic thin films have provided a highly successful test ground for understanding the microscopic mechanisms which determine macroscopically observable... (Read More)
See more product announcements for Wafer and Thin Film Instrumentation
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Wafer Measurement System from MTI Instruments
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