From Silicon Labs
As clock speeds and communication channels run at ever higher frequencies, accurate jitter and phase noise measurements become more important, even as they become more difficult and expensive to manage. While measuring ultra low-jitter devices and equipment, the engineer is continually required to ask whether the measurement values are the result of the device under test (DUT) or if they are due to the equipment being used. The engineer is also constantly looking for methods of expanding the reach of the equipment at hand. Here are some practical pointers and observations to assist in situations where clock signals have been divided down from higher frequency voltage-controlled oscillators (VCOs).
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Topics of Interest
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