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3D Visualization for Industrial Quality Inspection

From Leica Microsystems, Inc.

Vertical resolution in the balance between
numerical aperture and depth of field. Surface
analyses, fracture analyses, analyses of inclined or vertical surfaces or onsite inspections of large parts such as turbine
rotors are just a few examples in which the strengths of digital microscopes make the biggest difference

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Leica Microsystems, Inc. - Surface & Coating Quality - 3D Visualization
Digital microscopy offers clear advantages for a wide variety of industrial quality inspections, particularly surface analyses. But what are the key criteria for successful use of digital microscopes... (read more)
Element Materials Technology - Ultrasonic Inspection
Incredibly precise, fast, and economical, ultrasonic examinations can identify and plot discontinuities, such as inclusions and laminations,in a wide variety of wrought and finished metals, as well as... (read more)
Leica Microsystems, Inc. - Surface Structures - 3D Visualization
One of the main features of a digital microscope is the speed & ease with which it can enable creation of surface models of macro & microscopic structures. In a qualitative evaluation, these... (read more)
Bruker Nano Surfaces Division - Unrivaled Non-Contact Surface Metrology
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our optical... (read more)
Leica Microsystems, Inc. - Need Fracture Analysis or Quality Control?
Materials science relies on Digital Microscopy for specialized needs such as 360° viewing of components for quality control, or monitoring corrosion. Qualitative assessment of surfaces and movie... (read more)
PI (Physik Instrumente) L.P. - Fast Piezo Focusing Stages-n High Res Microscopes
A new, more affordable series of Fast Piezo Focusing devices is now available from piezo system specialist PI. The new PIFOC® system packages are designed to improve results in fast focusing &... (read more)
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