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From Pratt & Whitney Measurement Systems, Inc.
The wavelength of light provides a very high resolution, linear, and stable reference for dimensional measurement. Labmaster® instruments effectively couple the wavelength of light to the part to be measured. They do this by using a fringe counting laser interferometer1 to detect linear motion of a probe that contacts the part (a mechanical comparison). Labmasters employ patented laser paths that are in-line with the measurement axis to minimize Abbe2 error. The probes and associated optics are guided along very accurate low friction slides by precision force systems to minimize instrument error. Although direct gage block interferometers (wringing a block to a platen) use the same principles, Labmaster systems offer the advantages of a protected environment for the light path, direct readout, faster operation, lower cost, and the ability to measure many different parts. Labmasters have accuracy's equivalent to short-range comparators but offer increased productivity due to their wide direct reading range.
Although there are different methods for using a laser in measurement (such as Interferometry, triangulation, or scanning), Interferometry is typically orders of magnitude more accurate than other methods. Labmaster instruments use laser interferometers for the following reasons:
Product Announcements
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With instrument uncertainty to 2 millionths of an inch (50 nanometers), its suitable for OD applications such as gage blocks, ball bearings, optics, and film thickness. The Labmaster Standard is the...
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With instrument uncertainty to 2 millionths of an inch (50 nanometers), the Pratt Whitney Labmaster (LMU) is suitable for virtually all internal and external measuring applications. The Pratt Whitney...
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The Lapmaster/LAMTech TOPOS and SPI series of Interferometers feature Grazing Incidence flatness inspection and measurement capability for grinding, lapping & polishing applications. The need to...
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The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution.
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Your solution for vertical measuring is the Laseruler® which is laser-interferometer-based for very high accuracy. Our exclusive digital interferometer measures the dimension of the part by comparing...
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Polytec has delivered high-performance optical measurement systems geared towards dynamic and static characterization of structures for over thirty years. Structures characterized by Polytec's...
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The Surface Metrology Laboratory, located at Arnprior Rapid Manufacturing Solutions, houses the latest in 2D and 3D surface measurement and mapping instrumentation, customized profilometry software,...
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Polytec's latest technology is used for cutting edge applications in the field of Micro-Electro-Mechanical Structures (MEMS). Our Micro System Analyzer (MSA-500) combines powerful tools for analysis...
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Topics of Interest
15.1. INTRODUCTION TO SURFACE PROFILERS
Over the last 25 years, driven by both the development of new technologies such as
fast computers and solid state devices and the necessity to...
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The technique for measuring changes in diffuse surfaces using Electronic Speckle Pattern Interferometry (ESPI) is well known. We present a new electronic speckle pattern interferometer that takes...
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This paper describes a new light source, called the 'Ring of FireTM” (RoF), with a specific spatial coherence function, which greatly reduces the intrinsic instrument noise. The evaluation of a series...
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Faster product development and reduced time-to-market have made optical surface profilers essential tools for three-dimensional metrology of MEMS. The Veeco Instruments Wyko® NT Series Optical...
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1.1. INTRODUCTION
This chapter has been updated by the second author; it includes much of the material
from the previous version of the book. Newton, Fizeau, and Haidinger interferometers...
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