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Invitation to the SEM World

From JEOL USA, Inc.
 

 
SEM is now an indispensable instrument in a wide variety of applied fields. Many people who are not professional users of an SEM are now using the SEM as a tool in their research or production.This booklet has been edited for people who are being introduced to the SEM for the first time. Its purpose is to describe the basic purposes of and principles behind the SEM. Some typical objects that can be viewed with microscopes are shown below at the corresponding position of the scale below. There are many tools that can be used to view microscopic objects. Among them, the Scanning Electron Microscope (SEM) covers a wide range of magnification, about x 10 to x 1,000,000. The figure below, "(SEM Magnification)" indicates an appropriate SEM magnification for observing each object. Some of the SEM's most important features are easy magnification changing over, large depth of field (depth of focus), and stereographic image display.
Products & Services
Specialty microscopes are designed for specific applications such as metallurgy or gemology. They use specialized techniques or technologies such as acoustics to produce magnification. Search by Specification | Learn more about Specialty Microscopes
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn more about Electron Microscopes
Digital and video microscopes are instruments that use digital technology to magnify images of objects. They include built-in cameras and a series of high-powered lenses that provide superior image quality and resolution. Search by Specification | Learn more about Digital and Video Microscopes
Biological microscopes are used to study organisms and their vital processes. Search by Specification | Learn more about Biological Microscopes
Metallurgical microscopes are used for metallurgical inspection including metals, ceramics, and other materials. Search by Specification | Learn more about Metallurgical Microscopes
Product Announcements
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical... (read more)
M&P Lab (The) - Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental... (read more)
Renishaw - Infrared Spectroscopy System - Raman microscopes
Infrared spectroscopy can now be combined with Renishaw Raman microscopes to offer confocal Raman microscopy and infrared microscopy in a single instrument. This provides users with exceptional... (read more)
Stork Materials Technology - Failure Analysis
At Stork Materials Technology, our team of failure analysts specialists conducts in-depth investigations and analyses to determine the root cause of part and assembly failures and identify the means... (read more)
Akron Rubber Development Laboratory, Inc. (ARDL) - Electron Microscopy
Microscopic examination of samples can provide important information for product failure problem solving and product development. (read more)
Topics of Interest
2.1 LIGHT MICROSCOPY (LM) 2.1.1 Fundamentals Light microscopy (Hemsley, 1984; McCrone, 1974) is useful for studying the pigments for color, particle size and distribution, and concentration in... (Read More)
A new tabletop SEM combines the high magnification of electron microscopy with the ease of use of optical microscopy to improve performance in a benchtop instrument. A radical new breed of microscope... (Read More)
Electron microscopes utilize an electron that is scanned across a scanning electron microscope (SEM) or passed through a tranmission electron microscope (TEM) a sample to capture an image. The... (Read More)
The properties of many engineering materials are mostly governed by a combination of metal composition and the morphology and distribution of key microstructural features. These features can be... (Read More)
9.1 General The previous chapter considered optical ways of examining the surface. These are limited by the wavelength of light. As the requirement grows for detail much greater than the wavelength... (Read More)
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