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Electron Microscopy of Compound Materials Using Low Voltage STEM Mode (S-5200 SEM 103)

From Hitachi High Technologies America, Inc.
 

 
Various combinations of materials which have different compositions or hardness have been studied for development of advanced (functional) new materials. For microscopy of these materials, specimen preparation is a mandatory requirement. In addition to conventional unltra-microtomes, focused ion beams (FIB) systems have been extensively used. The FIB systems are advantageous in that they allow specimen preparation without giving mechanical forces to the specimen. A low voltage scanning transmission electron microscopy technique has been applied for observation of high polymer materials and it has been proved to be useful doe to high angle scattering of electrons which allow good imaging contrast. This technique has also been used for microscopy of semiconductor devices in combination with FIB systems and microscopy of biological sections.
Products & Services
Specialty or proprietary equipment and accessories related to laboratory sample preparation. Learn more about Specialty Sample Preparation Equipment
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn more about Electron Microscopes
Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Learn more about Microscopy and Metallography Sample Preparation Equipment
Digital and video microscopes are instruments that use digital technology to magnify images of objects. They include built-in cameras and a series of high-powered lenses that provide superior image quality and resolution. Search by Specification | Learn more about Digital and Video Microscopes
Optical and light microscopes use the visible or near-visible portion of the electromagnetic spectrum to magnify images of objects. Search by Specification | Learn more about Optical and Light Microscopes
Product Announcements
Testbourne Ltd. - SBT Sample Preparation Equipment Electron Micro
ELectron Microscopy Equipment South Bay Technology offers a complete solution for TEM specimen preparation. SBT offers systems for each stage of the preparation process from bulk material processing... (read more)
Olympus America Inc. - Visible and Nonvisible Imaging Techniques
By combining techniques, manufacturers can conduct fast, nondestructive measurement and analysis functions. Article by Matt Smith, Olympus Surgical Industrial America Inc. (read more)
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy (SEM)
ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy Services
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical... (read more)
M&P Lab (The) - Metallography Reference Kits
Metallography Reference Kits allow you to use standardized, pre-tested materials to demonstrate preparation techniques for Nadcap auditors. (read more)
M&P Lab (The) - Electron Microscopy
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental... (read more)
Topics of Interest
A low voltage STEM technique using a scanning electron microscope (SEM) allows high contrast images owing to high electron scattering and making visible subtle changes of densities and compositions in... (Read More)
A specimen preparation technique using FIB/TEM systems permits an excellent specimen preparation for transmission electron microscopy allowing 0.1 um or thinner specimens. This technique makes it... (Read More)
Process evaluation of semiconductor devices requires cross-sectional observations using SEMs for optimizing exposures and/or etching conditions. For this purpose wafers need to be fractured for... (Read More)
FIB (Focused Ion Beam) systems allow fine milling of site-specific areas. These systems have been extensively used for TEM specimen preparation and development and/or failure analysis of semiconductor... (Read More)
The combination of a focused ion beam system and a scanning transmission electron microscope has been applied to the three-dimensional observation of a resin-embedded yeast cell. Using a FIB... (Read More)
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