Go to GlobalSpec.com Home
Free Registration 
Download Engineering Toolbar
GlobalSpec Home
Find:      Advanced Search >>
Alert Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics)
High Resolution Cryogenic Microscopy Using the S-4700 FE-SEM (S-4700 SEM 96)
Find Products & Suppliers related to
High Resolution Cryogenic Microscopy Using the S-4700 FE-SEM (S-4700 SEM 96)
 
Research
High Resolution Cryogenic Microscopy Using the S-4700 FE-SEM (S-4700 SEM 96)
From hitachi-hta.com
Cryogenic scanning electron microscopy allows observation of water-containing samples in a frozen condition that permits sample morphology to be maintained in high vacuum conditions and close to their natural state. This technique has been widely used in food, biology and pharmaceutical fields for a long time. Recently it has been applied for high resolution cryogenic microscopy of protein particles. We have tested the capabilities of the S-4700 coupled with an Oxford cryogenic system using yeast, colloid and other samples. The S-4700 has s snorkel objective lens and achieves a high resolution of 2.1 nm at a low operating voltage of 1 kV. The Oxford cryogenic system allows operation of the S-4700 at short working distances that are preferred for high resolution work.
 


Products & Services
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition.
Biological microscopes are used to study organisms and their vital processes.
Metallurgical microscopes are used for metallurgical inspection including metals, ceramics, and other materials.
Measuring microscopes are used by toolmakers for measuring the properties of tools.  These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view.
Digital and video microscopes are instruments that use digital technology to magnify images of objects. They include built-in cameras and a series of high-powered lenses that provide superior image quality and resolution.
Back to Top

Product Announcements
Akron Rubber Development Laboratory, Inc. (ARDL) - Electron Microscopy
Microscopic examination of samples can provide important information for product failure problem solving and product development. (read more)
FEI Company - DualBeam™ Systems, Nova™ Family
The Nova family of DualBeam™ (FIB/SEM) systems are complete nanotechnology labs in a single tool. The Nova™ 200 NanoLab and the Nova™ 600 NanoLab are commonly used in nanostructure... (read more)
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical... (read more)
Integrity Testing Laboratory Inc. - Scanning Electron Microscopy (SEM)
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical... (read more)
FEI Company - Phenom
Phenom: Bridging the gap between optical and electron microscopy. Phenom is a high resolution desktop imaging tool with an optical camera for never-lost navigation and a high quality electron... (read more)
Advanced MicroSensors, Inc. - SEM/EDS
AMS offers Scanning Electron Beam Microscopy (SEM) and X-Ray Dispersive Spectra Photometry (EDS) services for process development, process verification and failure analysis. (read more)
Russells Technical Products - Cryogenic Freezers
Russells CB series cryogenic freezers are capable of achieving temperatures of -300º F to +500º F. To be able to withstand this extreme temperature difference, Russells has incorporated special... (read more)
JEOL USA, Inc. - Low Vacuum SEMs (LVSEMs)
JEOL Conventional Tungsten Low Vacuum SEMs --- For imaging and X-ray analysis of wet, nonconductive, unprepared samples. (read more)
Back to Top

Topics of Interest
Semiconductor devices have been moving toward higher integration and density. Similar technological trends are seen in various fields of science and industry. SEMS have been extensively used for... (Read More)
Compound materials have been used in various fields of science and industry. For evaluation of these materials, SEMs and FIB systems have been playing major roles. The SEM and FIB system allow... (Read More)
New analytical techniques such as cathodoluminesence (CL) and electron backscattered diffraction pattern (EBSP) have been brought into scanning electron microscopy (SEM) in addition to high resolution... (Read More)
Thanks to advancements in genome analysis, genetic information of various proteins is being resolved these days. For better understanding of the functions of proteins, 3 dimensional structure analysis... (Read More)
When imaging semiconductors specimens containing photo resist Hitachi’s S-4700 New ExB Filter can reduce charge appearance so that discrete atomic differences can be distinguished. By selectively... (Read More)
Back to Top
See more product announcements for Electron Microscopes
Power Tool For Grown Ups-- MultiBeam

Power Tool For Grown Ups-- MultiBeam
JEOL USA, Inc.


Transmission Electron Microscopes

Transmission Electron Microscopes
JEOL USA, Inc.


Scanning Electron Microscopes, Inspect™

Scanning Electron Microscopes, Inspect™
FEI Company


11 See more product announcements for Electron Microscopes



Home   |   About GlobalSpec   |   Advertise With Us   |   Site Map   |   Top Categories   |   Terms of Use
Privacy Policy   |   Link To Our Site   |   Submit a Site   |   Recommend This Site
©1999-2008 GlobalSpec.  All rights reserved.  GlobalSpec, the GlobalSpec logo, SpecSearch, The Engineering Search Engine and The Engineering
Web are registered trademarks of GlobalSpec, Inc. The Engineering Toolbar and DesignInfo are service marks of GlobalSpec, Inc.
No portion of this site may be copied, retransmitted, reposted, duplicated or otherwise used
without the express written permission of GlobalSpec Inc.   350 Jordan Rd, Troy, NY, 12180