X-ray Diffraction Characterization Of Residual Stresses Produced By Shot Peening

A brief overview of the theory and practice of x-ray
diffraction residual stress measurement as applied to
shot peened materials is presented.
The unique ability of x-ray diffraction methods to
determine both the macroscopic residual stress and the
depth and magnitude of the cold worked layer
produced by shot peening is described. The need to
obtain a complete description of the subsurface residual
stress distribution, in order to accurately characterize
the residual stress distributions produced by shot
peening, is emphasized.
Non-destructive surface residual stress measurements
are shown to generally be inadequate to reliably
characterize the residual stresses produced by shot
peening. Practical applications of x-ray diffraction
methods for quality control testing are considered.
Examples are presented for steel and nickel base alloys.