Burn-In Testing: Its Quantification and Optimization

Chapter 6: Burn-In Time Determination Using a Quick Calculation Approach

Overview

To determine the burn-in time, data like those given in Table 6.1 need to be obtained. This table is based, as an example, on 900 devices subjected to burn-in, and their performance is monitored in 10-hr intervals to determine the number of devices that fail in each interval. Next, the failure rate for each time interval is calculated. In Row 2 of Table 6.1 the equations for calculating the failure rate of these devices at each time interval are given. The first equation is

(6.1)

where

=

average estimate of the failure rate in each ? T time interval,

N F( ? T)

=

number of devices failing in ? T time interval, which in Table 6.1 is 10 hr,

N BP( T)

=

number of devices at the beginning of each ? T period involved,

and

? T

=

time interval for which the ( T) is calculated.

Table 6.1: Field data for a population exhibiting early plus chance failure characteristics.

It may be seen that the denominator of Eq. (6.1) is the total operating device-hours during the ? T interval. But in fact there are only [ N BP( T) -N F( ? T)] devices surviving this whole ? T period, while N F( ? T) devices fail during each interval. Therefore, the actual total device hours of operation by all devices being burned-in is less than N BP( T

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