An Introduction to Mixed-Signal IC Test and Measurement

By Gordon W. Roberts

An Introduction to Mixed-Signal IC Test and Measurement

This text encompasses the testing of both analog and mixed-signal circuits, value-added benefits of testing to a manufacturer s product, as well as the role of the test engineer.

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Table of Contents

The following content is available for browsing from this book:

An Introduction to Mixed-Signal IC Test and Measurement

Chapter 1: Overview of Mixed-Signal Testing

Chapter 2: The Test Specification Process

Chapter 3: DC and Parametric Measurements

Chapter 4: Measurement Accuracy

Chapter 5: Tester Hardware

Chapter 6: Sampling Theory

Chapter 7: DSP-Based Testing

Chapter 8: Analog Channel Testing

8.2: GAIN AND LEVEL TESTS

8.3: PHASE TESTS

8.4: DISTORTION TESTS

8.5: SIGNAL REJECTION TESTS

8.6: NOISE TESTS

8.7: SIMULATION OF ANALOG CHANNEL TESTS

8.8: SUMMARY

PROBLEMS

Chapter 9: Sampled Channel Testing

Chapter 10: Focused Calibrations

Chapter 11: DAC Testing

Chapter 12: ADC Testing

Chapter 13: DIB Design

Chapter 14: Design for Test (DfT)

Chapter 15: Data Analysis

Chapter 16: Test Economics

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