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Surface Texture Parameters

From Zygo Corporation
 

 
Every part's surface is made up of texture and roughness which varies due to manufacturing techniques and the part structure itself. To understand a component's surface and to control the manufacturing process to the degree required in today's modern world, it is necessary to quantify the surface in both two and three dimensions. Surface texture parameters can be grouped into these basic categories: Roughness, Waviness, Spacing, and Hybrid. Terminology Areal- A three dimensional surface area. Cutoff Filter- Determines the wavelength at which the surface structure is differentiated between roughness and waviness data. Proper selection of the correct filter cutoff in software is critical to measurement accuracy. Evaluation Length- The area from which data is obtained. It is a three dimensional area that corresponds to the instrument field of view, or a two dimensional profile that corresponds to the length of the slice as defined in the filled plot. Hybrid Parameters- These parameters are combinations of spacing and roughness parameters. Mean Line- A straight line that is generated by calculating a weighted average for each data point resulting in equal areas above and below the line. Also known as center line. Profile- A two dimensional slice through an area. Roughness Parameters - The finer irregularities in the surface texture which are inherent in the production process. These are a measure of the vertical characteristics of the surface.

Products & Services
Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Search by Specification | Learn more about Surface Profilometers
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects. Search by Specification | Learn more about Surface Metrology Equipment
Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity.  Search by Specification | Learn more about Form Gages and Form Gaging Systems
Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Learn more about Metrology Fixtures and CMM Fixtures
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Learn more about Styli and Probes

Product Announcements
Precitec, Inc. - Nemesis
NEMESIS is a high-precision, 3D measuring system for non-contact measurement of topography, profile, and transparent layer thickness. Precise operation in laboratories as well as in industrial... (read more)
Mahr Federal Inc. - MarSurf™ WS 1 Optical Surface Metrology System
Mahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf™ WS 1. Utilizing white light interferometry in a compact design, the... (read more)
Bytewise Measurement Systems - RoadMap™ Sensors
RoadMap™ sensors profile the surface of asphalt and concrete roads to help improve road smoothness and ride quality. The profile rate and accuracy are the highest in the industry. Use... (read more)
Olympus America Inc. - LEXT OLS4000 Laser Confocal Microscope
Olympus America has released the LEXT OLS4000 Measuring Laser Confocal Microscope. Designed for nanometer level imaging and measurement. Magnification ranges from 108x – 17,280x with resolution... (read more)
General Digital Corporation - Reflections on Reflections
Reflections from a display are a fact of life. By careful design of the display and installation, it is possible to produce a display with adequate luminance and contrast (for both specular and... (read more)
Tech Met - Texturing Implants
Tech Met has developed a patented technology for etching a surface texture on orthopedic implants for improved osseointegration. This technology provides several advantages over porous coating or... (read more)
Mahr Federal Inc. - MarSurf XCR 20
The new MarSurf XCR 20 from Mahr Federal combines two high precision measuring systems into one, enabling both roughness and contour measurements to be taken on the same unit and with the same setup. (read more)
MTI Instruments Inc. - Microtrak II Stand-Alone Laser Heads
High speed laser sensors designed to operate independently without a controller; for high volume OEM, production of QC applications. (read more)

Topics of Interest
18.10 Separation from roughness and waviness The separation of roughness and waviness from geometrical deviations (form, orientation, location, run-out) is not yet completely internationally... (Read More)
Maximum roughness depth refers to Rmax or Ry. Rmax is the maximum peak to valley profile height. Rmax, Ry, Rz1max or Rymax has the highest value of all peak to valley surface texture parameters. The... (Read More)
R Parameters were originally developed for two-dimensional, stylus type profiling applications. Many of these statistics were later adapted for three-dimensional use as well, for systems such as... (Read More)
3.2 Classification of parameters for the profile These are amplitude, spacing and hybrid parameters as shown in Figure 3.1. Amplitude and spacing parameters are self-evident. Hybrid parameters are... (Read More)
3.1 Specification Before embarking upon the parameter evaluation, some terms have to be established: R is roughness profile, W is waviness profile, P is... (Read More)