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From moxtek.com
A breadboard setup constructed at MOXTEK, Inc., is capable of capturing both x-ray diffraction (XRD) and x-ray fluorescence (XRF) information simultaneously using a charge-coupled device (CCD) as the x-ray detector. This preliminary setup will lead to a prototype simultaneous XRD/XRF instrument. NASA is funding the instrument’s construction because of its capabilities and small size; it could be used for future Mars missions for analysis of rocks. The instrument uses a CCD to capture both the energy and the spatial information of an incoming x-ray. This is possible because each pixel acts as a spatially addressable energy-dispersive detector. A powdered sample of material is placed in front of the CCD, which in turn is bombarded by a collimated x-ray beam. The instrument’s critical features—namely the x-ray source, collimation optics and x-ray transparent windows—allow for the first time, to the best of our knowledge, mounting the sample outside the CCD camera. In this paper the instrument’s design parameters as well as the properties of both a front-side-illuminated (FSI) CCD and back-side-illuminated (BSI) CCD as x-ray detectors are investigated.
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X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays.
Collimators are optical lens assemblies that take divergent or convergent incoming light rays and produces parallel light output.
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available.
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample.
Charge injection device (CID) cameras are used in analytical instrumentation, industrial machine vision, medical, scientific and aerospace applications.
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A test bench instrument constructed at MOXTEK, Inc. is capable of simultaneously capturing X-ray diffraction (XRD) and X-ray fluorescence (XRF) information using a charge-coupled device (CCD) as the...
(Read More)
Powder diffraction is a technique used by x-ray diffraction instruments. A powder or polycrystalline sample is irradiated with a beam of x-rays, and the resulting powder diffraction pattern is...
(Read More)
An X-ray shielded test chamber has been designed and built that includes a CCD-pinhole camera and energy-dispersive silicon PIN-diode detector for spectrum collection. The use of this chamber is an...
(Read More)
End-window transmission-target X-ray tubes are designed for very close anode-to-sample coupling for compact portable XRF instruments. Several recent improvements have been achieved to make these tubes...
(Read More)
Solid-state or semiconductor X-ray diffraction detectors collect diffracted intensity from one angle at a time and are scanned through the angular range of interest. These detectors provide the energy...
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