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Using AFM in Pharmaceutical Studies of Drug Crystal Growth, Particles, and Coatings (AN63)

From Veeco Instruments
 

 

Microscopic evaluation is important for the design and evaluation of a pharmaceutical product after the steps in the drug formulation process. Since atomic force microscopy (AFM) provides the ability to directly investigate surface structure at nanometer-to-subangstrom resolution in ambient and liquid environments, it has been applied to a wide range of pharmaceutical research, and delivers a powerful complement to other common analytical techniques. This application note describes the use of AFM from the studies of drug crystal growth, particle characterization, and tablet coatings in the manufacture of solid dosage forms.

AFM is performed by scanning a sharp tip on the end of a flexible cantilever across a sample surface, while maintaining a small, constant force. Tip types vary depending on application requirements, but they typically have an end radius of 5 to 10 nanometers. In a basic AFM setup, a piezoelectric tube scanner scans the tip in a raster pattern over the sample. Tip-sample interaction is monitored by reflecting a laser off the back of the cantilever onto a split-photodiode detector. Over the past several decades, a variety of scanning modes have been developed to control how the tip scans the sample. Contact mode and TappingMode™ are two of the more commonly used AFM techniques of operation.


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Topics of Interest
The ability of atomic force microscopy (AFM) to resolve structures on the nanometer-to-subangstrom scale in ambient and fluid environments has made it a particularly useful tool in pharmaceutical... (Read More)
Trace Laser beam to Detector Cantilever (Twist) Fast direction Retrace of raster-scan AFM Cantilever tip twist = Higher friction areas Figure 2. An electron micrograph of AFM cantilever and tip. In... (Read More)
Nanoindentation is an option for Digital Instruments MultiMode® and Dimension™ Series Scanning Probe Microscopes (SPMs). Using TappingMode™ AFM and an AFM diamond tip mounted to a... (Read More)
Lateral Force Microscopy (LFM) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. Applied with contact mode atomic... (Read More)
By maintaining a constant deflection during scanning, a constant vertical force is maintained between the tip and sample. Although contact mode has proven useful for a wide range of applications, it... (Read More)
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