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Drug Dissolution Studies with Atomic Force Microscopy (AN77)
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Drug Dissolution Studies with Atomic Force Microscopy (AN77)
 
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Drug Dissolution Studies with Atomic Force Microscopy (AN77)
From Veeco Instruments
 

 

The ability of atomic force microscopy (AFM) to resolve structures on the nanometer-to-subangstrom scale in ambient and fluid environments has made it a particularly useful tool in pharmaceutical research. AFM has been used with great success to evaluate many of the steps in the drug fabrication process, including studies of drug interactions, gene delivery vehicles, crystal growth, and particle formation. Once a drug is formed, its dissolution properties have a direct effect on its absorption in the body. In addition to the wide range of uses in drug fabrication, AFM has also been successfully utilized to study the dynamics of the dissolution process, and has added to our overall understanding of this process at the molecular scale. This application note discusses the utility of AFM in dissolution studies and details some example studies on acetaminophen and aspirin surfaces.

AFM is performed by scanning a sharp tip on the end of a flexible cantilever across a sample surface, while maintaining a small, constant force. Tip sizes and materials vary depending on application requirements, but they


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Topics of Interest
Microscopic evaluation is important for the design and evaluation of a pharmaceutical product after the steps in the drug formulation process. Since atomic force microscopy (AFM) provides the ability... (Read More)
Since atomic force microscopy (AFM) provides the ability to investigate surface structure at nanometerto-subangstrom resolution in ambient and liquid environments, it has been used routinely over the... (Read More)
By maintaining a constant deflection during scanning, a constant vertical force is maintained between the tip and sample. Although contact mode has proven useful for a wide range of applications, it... (Read More)
Trace Laser beam to Detector Cantilever (Twist) Fast direction Retrace of raster-scan AFM Cantilever tip twist = Higher friction areas Figure 2. An electron micrograph of AFM cantilever and tip. In... (Read More)
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