Go to GlobalSpec.com Home
Newsletter   FREE GlobalSpec e-Newsletters
Receive the latest news, trends, and technology relevant to your work.
(See Titles)

Scanning Tunneling Microscopy: A tool for Studing Self-Assembly and Model Systems for Molecular Devices (AN85)

From Veeco Instruments
 

 

The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling microscopy (STM) was soon recognized and culminated in the award of half the 1986 Nobel Prize in Physics to Binnig and Rohrer. Early STM work focused mainly on the clean, bare surfaces that exist under ultrahigh vacuum (UHV) conditions and provide ideal systems for formulating and testing theories of tip-sample interactions and electron transport. A great expansion of STM research was started in 1986, when
Digital Instruments introduced the first commercial scanning tunneling microscope operating in ambient conditions, the NanoScope STM.

The ability to perform STM work in air, under solutions, and within electrochemical cells has made the interrogation of self-assembly practical. The high resolution achieved with relative ease in STM images sets this technique apart from other SPMs and has allowed numerous STM studies to address the structure and dynamics of self-assembled monolayers in exquisite detail. Two-dimensional self-assembly on surfaces and at interfaces is often cited as an important ingredient for any


Product Announcements
Veeco Instruments - Dimension V Scanning Probe Microscope (SPM)
Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm. (read more)
Veeco Instruments - MultiMode V
The next generation of the world's best-selling, most field-proven SPM, incorporating the high-speed, high-resolution Nanoscope V controller. (read more)
Electromate - New Integrated Motor ‘Shipped From Stock’
The STM is a stepper drive + motor unit fused into a single device that offers significant savings on space, wiring & cost when compared with conventional motor & drive solutions. Powerful... (read more)
Veeco Instruments - PicoForce
Innovative force-measurement features and handheld PicoAngler force-feedback device allows quantified and tactile interpretations of molecular structure. (read more)
FEI Company - Phenom use for Pharmaceutical Inspection
FEI's Phenom is a revolutionary tabletop SEM with magnifications up to 20,000x. The Phenom's intuitive touch-screen controls and never-lost sample navigation features remove the difficulties... (read more)
WDI Wise Device Inc. - Smallest Confocal Microscope on the Market
The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and... (read more)
Kellett Enterprises, Inc. - Specialty Shock and Vibration Control Products
Whether you call it a vibration pad, vibration isolation pad, vibration isolator, damping or dampening pad, machine mounting pad, shake or shock absorber….the LP-13 Shake Absorber® does it all!... (read more)
FEI Company - Electron Imaging Can Improve Your Science Courses
The Phenom personal electron microscope brings the sub-micron world within easy reach of teachers and students. (read more)

Topics of Interest
Chapter List Chapter 2: Scanning Probe Microscopy - Principle of Operation, Instrumentation, and Probes Chapter 3: Probes in Scanning Microscopies Chapter 4: Noncontact Atomic Force... (Read More)
8.2 Structural Characterization Characterization of nanomaterials and nanostructures has been largely based on the surface analysis techniques and conventional characterization methods developed for... (Read More)
U. Hartmann Overview Previous chapters give an introduction to novel magnetic imaging methods based on the scanning tunneling microscope (STM) or on the scanning force microscope (SFM). While... (Read More)
A. Thiaville J. Miltat J.M. Garc a Magnetic force microscopy is a scanning technique, derived from atomic force microscopy, that maps the magnetic interaction between a sample and a magnetic tip. It... (Read More)
6.5 Nanorheological and mechanical properties of polymeric surfaces and thin films measured by SFM In section five of Chapter 6, we are concerned about the measurements of nanomechanical properties... (Read More)