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From Veeco Instruments
The system controller is a critical component of any Scanning Probe Microscopy (SPM) system. Digital Instruments NanoScope Controllers have set the industry standard since its inception over a decade ago. The DAC configuration is an integral part of the digital feedback loop in any controller, and plays a major role in its level of control, accuracy, resolution, and noise. One of the primary improvements implemented when Digital Instruments replaced the NanoScope II with the NanoScope III control system was the enhancement of the digital-to-analog converter (DAC) configuration for scanner control. The NanoScope II used a single DAC on each scan axis for scan control. Although this configuration was considered state-of-the-art at the time, it was improved with the introduction of the NanoScope III controller in 1991 which implemented three 16-bit DACs on each scan axis for the control of the scanning, scaling, and offset (Figure 1). We found this configuration to be so successful that we continued it in the current NanoScope IIIa and E control systems. Product Announcements
Topics of Interest
The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling...
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By limiting the bandwidth in any of average. This can be implemented in INFLUENCE OF THE MEASUREMENT these ways it is possible to exclude two different ways. First, the ramp rate BANDWIDTH a portion...
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Increasingly, DAC's are a limiting factor in nanopositioning resolution, especially in the latest millimeter-travel stages. A newly patented technology adds up to 10 bits of resolution to virtually...
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5.3 Nyquist-Rate DACs
Integrated Nyquist-Rate DACs
Recall that for a DAC, the digital input word M in in Equation (5.1) is dimensionless, and the analog output signal N out has the same...
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AFM measurements are limited by the shape of the tip used to probe the sample surface. As the tip wears, the finite size of the AFM tip may not allow the tip to accurately probe narrow or sharp...
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