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Studies of Metallic Surfaces and Microstructures with Atomic Force Microscopy (AN28)

From Veeco Instruments
 

 

Atomic Force Microscopy (AFM) is capable of generating 3D images of surface topography with nanometer and Ångstrom resolution. This powerful technology allows material scientists new insight into the diversity of microstructures and defects. Applications of AFM to metal specimens allow quick and easy generation and quantification of images in the sub-micrometer and nanometer range. Reliable measurements of microstructural parameters are of great relevance for developing new alloys and for quality control in industrial production processes. No vacuum is needed for the atomic force microscope, and even measurements in liquids, such as diluted acids, are possible.

This application note describes how AFM provides the ability to study morphology, in-situ fracture processes, and plastic deformations on standardized specimens with resolutions that are unattainable with other measurement techniques.

Metallic structural detail covers many orders of magnitude in size. Therefore, different microscopic techniques like optical microscopy, scanning electron microscopy (SEM) and, for even higher resolution, transmission electron microscopy (TEM), are used for visualizing these microstructures.

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Topics of Interest
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