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Dynamic Interferometry: Getting Rid of the Jitters
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From 4D Technology Corporation
Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors where it is difficult to mechanically isolate them and the structures needed to support the optical test; in addition, long optical paths produce air turbulence problems. To make things worse, the next generation of large-aperture lightweight mirrors for space-telescope applications must be tested in vacuum chambers at cryogenic temperatures where vibration is virtually impossible to control. The newer dynamic interferometers help solve these problems with even better accuracy than traditional temporal phase shifting interferometers. Products & Services
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects.
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Learn more about Surface Metrology Equipment
Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources.
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Learn more about Interferometers
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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Learn more about Wafer and Thin Film Instrumentation
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Topics of Interest
Mechanical vibration and turbulent airflow present significant problems for most interferometric test methods. Conditions on the factory floor and in industrial clean rooms with high-capacity air...
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Dynamic interferometry is a standard technique for measuring optics, meter-class optics and optical systems in challenging environments. The method provides high out-of-plane resolution and...
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In the testing of optical components and optical systems there are many requirements on the precision and accuracy, measurement time, ease of use, dynamic range, and environmental conditions.
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The technique for measuring changes in diffuse surfaces using Electronic Speckle Pattern Interferometry (ESPI) is well known. We present a new electronic speckle pattern interferometer that takes...
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This chapter discusses moire, fringe projection, structured illumination, holographic
interferometry, digital holography, and speckle interferometry techniques for testing
diffuse surfaces. Diffuse...
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