Technical Articles


Cirris Systems Corp.

Cirris Systems Corp. has published these technical articles:

From this Article:
A common testing problem is determining whether a reported failure is truly a problem with the Device-Under-Test or a problem with the test interface. Test connectors wear out with repeated usage,... (View Full Article)
From this Article:
The continuous electrical path between 2 or more points wherein current flows. This path has low resistance, usually less than 5 ohms. The path is constructed with metal parts, such as copper wire,... (View Full Article)
From this Article:
Pins that can scrape or poke through the oxide on the contacts. You'll find test block pins may need to use spring-loaded contacts. See this list of test block resources.... (View Full Article)
From this Article:
In order to assure valid testing on your harness or cable tester you MUST verify that it is programmed correctly BEFORE you begin testing cables. The most effective workflow for testing cables and... (View Full Article)

New Privacy Policy

We have adopted new policies. Please read each one carefully.