Scanning electron microscope as a commonly used microscopic analysis tools, can be observed on all types of metal fracture, fracture type determination, morphology analysis, failure analysis and other research.

By observing and studying the morphology of the fracture, we can analyze the cause, nature, mode, mechanism, etc., and also understand the details of the stress condition and crack expansion rate at the time of fracture. Like a "scene", the fracture retains the whole process of fracture occurrence. Therefore, for the study of metal fracture problems, observation and analysis of fracture is a very important step and means. Scanning electron microscope has the advantages of large depth of field and high resolution, and has been widely used in the field of fracture analysis.

CIQTEK SEM4000Pro has perfect function and reliable quality, not only provides a reliable basis for the research of improving the material properties, but also plays an important role in the control of the production process and the design and research of new products.

Analytical field emission scanning electron microscope (FESEM) equipped with a high-brightness long-life Schottky field emission electron gun

With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples.

Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.