cousto-Optic Deflectors for Precision Scanning
Featured Product from CASTECH, Inc.

High-Speed Acousto-Optic Deflectors for Precision Scanning
Acousto-optic deflectors (AODFs) are designed to provide high-speed scanning of laser beams with precise control over scanning position. These devices achieve beam deflection by varying the RF driving frequency, allowing for random positioning, continuous line scanning, and sequential point deflection. With scan rates exceeding 200 MHz, AODFs provide fine position control in the nano-radian range.
The efficiency of an AOD typically relies on aligning the laser beam to a Bragg angle. Any mismatch in this angle due to frequency deviations results in reduced efficiency. CASTECH’s team leverages years of experience to overcome this challenge by using innovative techniques such as longitudinal modes and phased array piezoelectric cells within the transducer, enabling the production of high-resolution AODs with broad bandwidth and high efficiency.
Our AODs are available for both 1D and 2D scanning applications, and with our specially developed broadband RF drivers, we offer versatile control methods like frequency sweeping and chirping. This versatility allows customers to quickly implement a range of functions with minimal setup.
Key Features:
- High-speed scanning with rates over 200 MHz
- Precision control of beam position down to nano-radians
- Custom-designed for 1D and 2D scanning
- Enhanced efficiency through longitudinal modes and phased array transducers
- Broad bandwidth AODs for varied applications
- Compatible with advanced RF driver for sweeping and chirping functions
Applications:
- Laser Display: High-speed beam steering for dynamic display applications
- Micromachining: Precision deflection for accurate material processing
- Heterodyne Interferometry: Enhanced performance in optical measurement systems
- Laser Tweezers: Fine control in biological and medical applications
- Optical Inspection: Advanced scanning for high-precision inspection systems
- Heterodyne Systems: Effective in high-performance measurement setups