Smart coatings analysis for faster measurement

Featured Product from Hitachi High-Tech America

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The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking analyzers that effectively ‘set up’ themselves, making it possible to analyze many more parts within a single shift.

Automation and innovative software are what make the FT230 and FT210 analyzers. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the instrument takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment.