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New sample scanning atomic force microscope:MadAFM

Featured Product from Mad City Labs, Inc.

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MadAFM™ 
MadAFM™ is a new sample scanning atomic force microscope (AFM) designed for ease-of-use and simple installation.   The MadAFM™ includes our industry leading closed loop nanopositioners for precision movement of the sample and probe.  Mad City Labs has designed and manufactured piezo closed loop nanopositioners for over 25 years.  Our nanopositioners offer the lowest noise and highest resolution available due to our proprietary PicoQ® sensors.   These sensors are renowned for their ultra-low noise performance.  Our nanopositioners have a proven track record with our high performance resonant probe AFMs yielding true decoupled motion with virtually undetectable out-of-plane motion.  

In addition to XYZ nanopositioners, the MadAFM™ integrates our intelligent control, high stability motorized micropositioners.   These micropositioners allow long range motion of the sample (XY), focus control, and motion of the AFM head (Z).   The focus, AFM head, and probe positioners are vertically aligned and coaxial which allows direct on-axis views of the sample surface and cantilever using a 1.6MP CMOS camera.   Sample illumination is via a coaxial white LED while the 635nm laser alignment is via camera aided manual operation.   MadAFM™ can accomodate samples up to 50mm x 50mm x 40mm in size.
MadAFM™ supports multiple microscopy modes (see specification table) and includes AFMView®-OD software that handles all hardware control and data acquisition.    The user-friendly software features automated calibration and initialization to allow even novice users to get up and running quickly.   The software allows advanced users to have access to specified parameters.   MadAFM™ is compatible with 3rd party analysis software MountainsSPIP® and Gwyddion. 
MadAFM™ is sized for table tops and simple to install with minimal user setup. 

Features

  • Low noise atomic step performance
  • Calibrated flexure guided closed loop nanopositioners
  • Less than 1nm out of plane motion over scan range
  • Proprietary PicoQ® low noise sensors
  • Long travel, high stability micropositioning
  • Automated calibration and initialization
  • Automated software and hardware setup
  • Adjustable parameters for experienced users
  • User-friendly probe exchange
  • Simple to install, table top design
  • Includes AFMView® software - hardware control & data acquisition
  • Image analysis software option

 

Applications

  • Atomic Force Microscopy
  • Phase Microscopy
  • Magnetic Force Microscopy
  • Electric Force Microscopy
  • Lateral Force Microscopy
  • Scanning Tunneling Microscopy
  • Kelvin Probe Microscopy
  • Conductive AFM
  • Electric Force Microscopy
  • Piezoelectric Force Microscopy
  • Nanolithography
  • Biological AFM

 

Mad City Labs, Inc
Mad City Labs, Inc has been a leading manufacturer of flexure based piezo nanopositioning systems capable of sub-nanometer positioning resolution since 1998. Our piezo nanopositioning product line covers the entire spectrum of piezo nanopositioning capabilities while maintaining a leadership role in multi-axis stages for high speed optical microscopy imaging. Mad City Labs engineers use 3D CAD and finite element analysis to produce piezo nanopositioners which combine long ranges of motion with exceptional linearity, orthogonality, and stability. Our in-house CNC machining centers and wire EDMs provide complete control of mechanical assembly production and allow Mad City Labs to design and fabricate custom systems with minimal engineering costs and short lead times. We deliver the tools for nanotechnology in 30 to 45 days and provide the highest level of customer service and satisfaction in the industry. We provide innovative and practical solutions for today’s demanding biotechnology and nanotechnology applications. Most Mad City Labs piezo nanopositioners can be controlled by our high speed USB 2.0 interface. Applications for nanopositioners include super resolution microscopy, high speed confocal imaging, AFM, NSOM, scanning probe microscopy, fiber positioning, single molecule spectroscopy, single molecule/particle tracking, high resolution optical alignment, SR optical microscopy, sub-diffraction limit microscopy, nanoscopy and lithography.