Sequential WDXRF spectrometer - ZSX 400

Product Announcement from Rigaku Corporation

Sequential WDXRF spectrometer - ZSX 400-Image

The Wavelength-Dispersive (WD) XRF technique enables elemental analysis (composition and film thickness) with high energy resolution. The Rigaku ZSX 400 is a sequential WDXRF spectrometer specifically designed to handle very large and/or heavy samples. Accepting samples up to 400mm diameter, 50mm thick, and 30kg mass, the ZSX 400 is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology on Si wafers. The ZSX 400 is an ideal R&D system offering the widest range of analytical flexibility covering the element range from Be to U with spot sizes down to 0.5mm diameter for spatially resolved (uniformity) measurements. The optional video camera and lighting system enables the specific measuring point to be viewed for QC or FA applications.


  • Large sample analysis up to 400 mm (diameter), 50 mm (thickness), 30 kg (mass)
  • Flexible sample adapter system with inserts (made to order)
  • Measurement spot 30 mm - 0.5 mm diameter with 5-step automatic selection
  • Mapping capability allows uniformity to be checked
  • General purpose: able to analyze Be to U by high-resolution, high-accuracy WDXRF
  • Wide range of composition (ppm to tens of percent) and thickness (sub Å to mm)
  • Software guides the user through measurement and analysis setup
  • Compliant with industry standards: SEMI S2 and S8, CE marking
  • Small footprint: 50% footprint of the previous model