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High Bandwidth Test Socket for IC Testing

Featured Product from Smiths Interconnect

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The Levan Elastomeric socket family is engineered specifically with precision. The elastomeric grid of Levan features conductive columns that guarantee accurate and consistent test results across a spectrum of devices. The conductive columns in the elastomeric grid ensure accurate and consistent test results for various devices. Its high bandwidth and low inductance capabilities render it electrically invisible to the test system, safeguarding against ball damage to Devices Under Test (DUT) and providing unmatched electrical and mechanical advantages. Levan elevates testing standards from engineering requirements to high-volume production, ensuring versatility and cost-effectiveness. It’s a great test solution for BGA, LGA, QFN and other variants.