Fischer Technology, Inc.

FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

The X-ray source and detector are the heart of an X-ray fluorescence instrument. The FISCHERSCOPE XDV-SDD (silicon drift detector) is excellent for measuring very thin layers, trace elements, very small concentrations, elements with low atomic numbers (Na, Mg and Al) using high counting rates for fast measurement and high repeatability. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

FISCHERSCOPE® XDAL® 237 is especially well suited for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the perfect instrument for automated measurements in quality assurance and production monitoring. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

Specialized for the cost-effective analysis of gold alloys, FISCHERSCOPE® X-RAY XAN® family of instruments are available with different detectors, making them optimally suited for customer requirements, from a few elements to more complex analysis with many elements. Read more...

More Product Announcements from Fischer Technology, Inc.