Micro-Epsilon Group

The surfaceCONTROL 3500 3D sensor is used for inline inspection of geometry, shape and surface on diffusely reflecting surfaces such as metal, plastic or ceramics. With a z repeatability of < 0.4 µm, the sensor reaches a new level of precision and reliably detects the smallest deviations in planarity and height. Powerful software tools enable precise 3D measurements and surface... Read more...

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Zygo Corporation

This podcast features discussions with Jack Clark, Senior Principal Scientist at Woodward Inc., and Dr. Chris Evans, Professor of Mechanical Engineering and Director of the Center for Precision Metrology at the University of North Carolina at Charlotte.

An essential aspect for those in the field of surface metrology (or looking to become a part of it) is entertaining different per... Read more...

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Zygo Corporation

In this webinar, ZYGO Applications Engineer Mackenzie Massey highlights a case study that focuses on how measurement data can be used to drive process optimization of laser-grade optical surfaces, using advanced non-contact areal metrology tools. Read more...

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ABTech, Inc.

Our Engine Assembly Systems with the Genspect Stack Projection Software System© developed by General Electric© help manufacturers and maintenance organizations increase productivity by integrating turbine engine stack projection capabilities within the production and overhaul process. Read more...

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ABTech, Inc.

ABTech is committed to providing the highest level of customer support. This starts from your first contact and extends through the entire product life cycle. With expertise in every facet from the component level to building sophisticated turnkey assembly systems, we understand every aspect of precision applications that require tight geometric tolerances.  Read more...

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Zygo Corporation

The APM650™ packaging metrology system is a new inspection tool for automated measurement of panel-based PCBs and other advanced packaging applications. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision. Read more...

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