Teledyne DALSA has developed cutting edge CMOS sensor technology for use in dental imaging systems, including cone beam computed tomography (CBCT), panoramic and cephalometric imaging. Teledyne detectors are designed specifically for demanding X-ray applications, and offer low-dose performance advantages over traditional film or alternative detector options. Read more...More Product Announcements from Teledyne DALSA
Hitachi High-Tech Analytical Science expands its range of coating analyzers. Designed to play a key role in production quality control, the FT series coatings analysers measure a wide range of applications in the metal finishing and electronics markets. The FT110A and FT150 series offer new solutions to measuring large parts with complex geometry and measuring ultra-thin coatings on smal... Read more...More Product Announcements from Hitachi High-Tech Analytical Science
Moxtek's new DPP-60 is an incredibly small OEM Digital Pulse Processor. The size and intuitive command structure allow easy integration into OEM instruments with PIN, SDD, Ge, or CdTe detectors. Read more...More Product Announcements from MOXTEK, Inc.
Combining leading-edge technologies, both, in wafer handling and micro-structure metrology, the new FISCHER metrology solution XRAY XDV-μ SEMI for advanced packaging and other semiconductor manufacturing applications enables an entirely new dimension in cost-effective quality control on the factory floor. Read more...More Product Announcements from Fischer Technology, Inc.
RAYCON D product inspection system will consistently and precisely detect a multitude of contaminants such as magnetic and non-magnetic metals, glass, ceramics, stones, raw bones, and some types of plastics, even when products are packaged in aluminium or other metallic foils. Read more...More Product Announcements from Sesotec GmbH
AP Windows are ideal for applications that require high transmission of low-energy x-rays in high vacuum with differential pressure and the highest possible vacuum integrity. AP windows are most commonly used in microanalysis applications
Moxtek’s AP windows have established the standard for light element detection x-ray windows. Our AP windows have survived over 10,000 cycl... Read more...More Product Announcements from MOXTEK, Inc.
Measuring applications in the electronics industry are extremely diverse and often very challenging. To ensure the ideal instrument is available to suit the particular needs of the customer, FISCHER offers a broad range of X-ray fluorescence measurement systems. Read more...More Product Announcements from Fischer Technology, Inc.
FISCHER, a manufacturer of nondestructive coating thickness measurement, material testing, and material analysis instrumentation, exhibits at tradeshows around the world. Read more...More Product Announcements from Fischer Technology, Inc.
Precious metals are the basis for jewelry production; however, they are also often used in high-tech industries such as electronics and medicine. Highest purity of the base metals, precise alloying and control of trace and minor elements are the basis of all precious metal products. Read more...More Product Announcements from Fischer Technology, Inc.
As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...More Product Announcements from Fischer Technology, Inc.