Products & Services

See also: Categories | Featured Products | More Information

More Information Top

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire

  • Acoustic Scanning Probe Microscopy
    The expansion coefficient F1 is the interaction force gradient and plays a role in the interaction force similar to that of the cantilever spring constant.
  • Nanotribology and Nanomechanics I
    The lower surface is supported on a cantilever spring which is used to push the two surfaces together with a known load.
  • Springer Handbook of Nanotechnology
    Fre- quency changes have been found to be caused by mass loading or adsorption-induced changes in the cantilever spring constant.
  • Nanotribology and Nanomechanics
    The lower surface is supported on a cantilever spring which is used to push the two surfaces together with a known load.
  • Springer Handbook of Nanotechnology
    Frequency changes have been found to be caused by mass loading or adsorption-induced changes in the cantilever spring constant.
  • Nanotribology and Nanomechanics
    The lower surface is supported on a cantilever spring which is used to push the two surfaces together with a known load.
  • Springer Handbook of Nanotechnology
    The deflection can be measured to within 0.02 nm, so for typical can- tilever spring constant of 10 N/m a force as low as 0.2 nN (corresponding normal pressure ∼ 200 MPa for a Si3N4 tip with radius of about …
  • Scanning Probe Microscopy
    If the stiffness of the cantilever spring k (spring constant) is known, the force between tip and sample can be determined by measuring the bending of the cantilever.
  • FIB Nanostructures
    After performing the required measurements, the spring constant of the test cantile- ver can be determined by the following equation, where ktest and kref are the test and reference cantilever spring constants, respectively; SC and SH are the deflection sensitivity measured on …
  • Applied Scanning Probe Methods VIII
    Cantilever Spring -Constant Calibration in Atomic Force Microscopy .