Measuring / Toolmaker Scanning Probe Microscopes
from Polytec, Inc.
The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution... [See More]
- Application: Measuring / Toolmaker / Inspection; Semiconductor; Microscope Scanning Vibrometer
- Lateral Resolution: 1000