Register for this Webinar
On-Demand Webinar:

Oscilloscope applications: Fast debugging of high-speed digital and RF interfaces

Join this webinar to learn how the R&S®RTP high-performance oscilloscope allows for de-embedding in real-time through its unique hardware configuration. Learn how real-time processing of the waveform data ensures maximum update rate for effective troubleshooting in the time and frequency domain, and allows triggering on the corrected waveforms.



Date: September 9, 2019
Time: 10 AM EDT (7 AM PDT / 4:00 PM CEST)
Duration: 1 hour
Presented by:

Overview

Being able to see real signals and not artifacts of the test setup such as loading or reflections is critical whether you are debugging a high-speed interface such as DDR or Pcle, characterizing a fast clock or analyzing a complex RF signal.

Join this webinar to learn how the R&S®RTP high-performance oscilloscope allows for de-embedding in real-time through its unique hardware. Learn how real-time processing of the waveform data ensures maximum update rate for effective troubleshooting in the time and frequency domain, and allows triggering on the corrected waveforms.

Key Takeaways

  • Gain greater insight into the fundamentals for fast debugging of high-speed digital and RF interfaces
  • Understand more about real-time de-embedding
  • Learn about Rohde & Schwarz oscilloscopes and our solutions

Please note that by registering for the webinar, your contact information will be shared with the sponsoring company, Rohde & Schwarz GmbH & Co.KG and the Rohde & Schwarz entity or subsidiary company mentioned in the imprint of www.rohde-schwarz.com, and you may be contacted by them directly via email or phone for marketing or advertising purposes.

Speaker

Guido Schulze, Product Manager, Ocsilloscopes, Rohde & Schwarz

Guido Schulze has more than 20 years experience in high-speed digital testing. He has worked in the last ten years as product manager for the oscilloscope product division of Rohde & Schwarz and focuses there on the high-end models and respective applications.