This webinar is designed for engineers who deal with high-speed digital and RF signal measurements while using plenty of cables, converters, adapters, text fixtures and amplifiers. It will explore the impact of the measurement setup on the results and the methods that can help you obtain the real signal of the device under test, something that is required by multiple standards.
Attendees will learn in great detail about the error sources such as bandwidth limitation, impedance mismatch, coupling and probing effects. The presenters will discuss and use demonstrations to show how you can model and eliminate those errors.
Defining system parameters, extracting and importing S parameters and observing the de-embedded response are key steps of an easy de-embedding process. The presenters will demonstrate with an oscilloscope, including the necessary software and real-time hardware options.
- Learn the ins and outs of de-embedding for testing high-speed digital and RF signals
- Understand error sources such as bandwidth limitation, impedance mismatch, coupling and probing effects
- Learn key steps such as defining system parameters, extracting and importing S parameters and observing the de-embedded response
- Discover insights on Rohde & Schwarz oscilloscopes
Guido Schulze has more than 20 years of experience in high-speed digital testing. For the last ten years, he has worked as a product manager for the oscilloscope product division at Rohde & Schwarz. He specializes in high-end models and their respective applications.
Jithu Abraham works for Rohde & Schwarz as a product manager for the U.K., Ireland and the Benelux region, specializing in oscilloscopes. He enjoys all aspects of high-speed digital, wireless communication, efficient power conversion and all the challenges they bring. Jithu holds an engineering degree in electronics and communication from the Anna University in India and a master's degree in RF systems from the University of Southampton. He has been working for Rohde & Schwarz for over 12 years.