High-resolution optical backscatter reflectometry (OBR) has become a valuable tool in the design, test and diagnostics of fiber components, photonic integrated circuits (PICs) and short fiber networks. In much the same way that standard OTDRs identify and locate issues and sources of loss in long-range fiber optic systems, high-resolution OBRs can locate and identify issues and defects with sub-millimeter resolution and since they don't suffer from the "deadzones" associated with OTDR, they are ideal for components and short-run optical networks like those found in modern, high-speed communications networks and data links. This webinar will review how OBR technology works, how it differs from alternative reflectometry techniques, and describe real-world application examples. These application examples include characterizing the optical performance and quality of silicon photonic components such as waveguides and troubleshooting short fiber networks like those found in data centers and on aircraft. These application examples will illustrate how high-resolution OBR delivers an extreme level of detail and sensitivity in identifying sources of loss (bends, breaks, bad splices, defects, interfaces, etc.), as well as making very precise latency measurements. The webinar will include live software demos to illustrate the operation of OBR instruments with real-world optical components and systems.
- Learn the fundamentals of optical backscatter reflectometry (OBR)
- Learn how to use OBR to "see inside" devices and analyze photonic integrated circuits, including silicon photonics, and short fiber networks with sub-millimeter resolution
- Learn how OBR compares to high-resolution OTDR and other optical reflectometry technologies
Dr. Soller is currently Vice President and General Manager for the Lightwave Division of Luna Innovations. Dr. Soller co-developed the instrumentation for fiber optic instruments manufactured by Luna and is a recognized expert in the field of optical instrumentation. He received a bachelor's and master's degree in mathematics and physics from the University of Wisconsin - La Crosse, and a doctoral degree from the Institute of Optics, University of Rochester.