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  • Engineer's Assistant Using a PIC16F84A
    and ON/OFF switching is activated by two keys. The probe tip is the common input for all functions, and the GND cable is used for connection to Vss of the tested circuit.
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Startup looks to handle back-end IC production at wafer level A low-profile probe-card company has unveiled a new process it claims will consolidate entrenched, time-consuming test and packaging methods, slash costs and bring Moore's Law-type scaling to the back end of semiconductor manufacturing
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    between digital televisions and the functions accessible via next-generation cable set-top boxes. Positrons probe quantum dots for defects A practical non-destructive test method for probing ultrasmall quantum dots may be the fallout from experiments at the U.S. Department of Energy's Idaho National
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Philips ships next-generation RFID chips Royal Philips Electronics said it's shipping RFID chips based on the new ultra-high-frequency electronic product code. Philips readies RFID chip that meets global spec Royal Philips Electronics of the Netherlands said it is testing engineering samples
  • Marketplace
    hardware, which offers improved sensor linearization and temperature compensation, while providing more consistent product performance. Options include fixed and interchangeable probes and calculated outputs such as dewpoint. Visit them at Interphex2004 Booth C2226. Rotronic Instrument Corp. Circle

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