Products/Services for Contour Profilometer
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Surface Profilometers - (198 companies)Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Surface profilometers are used to measure surface profiles, roughness, waviness, and other finish...Show MoreTechnologySurface MetrologyMeasurement Capability -
Form Gages and Form Gaging Systems - (93 companies)Form gages and form gaging systems are used to inspect parameters such as roundness, angularity, squareness, straightness, flatness, runout, taper and concentricity. Form gages are similar to profilometers, inspection tools used to measure surface...Show More -
Surface Metrology Equipment - (328 companies)Types of Metrology Equipment. There are two main types of surface metrology equipment: form gages and surface profilometers. Form gages, form gaging systems, and contour measuring machines are used to inspect parameters such as roundness, angularity...Show More -
Styli and Probes - (78 companies)Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners. Styli and probes are slender rod-shaped stems and contact tips or points...Show More -
Wire Mills and Wire Flattening Machines - (51 companies)Wire mills and wire flattening machines produce square or rectangular flat wire as well as shaped wire with contoured cross-sections and complex profiles. They flatten or produce profiles and shapes on the wire itself by drawing it through rolls...Show More
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Semiconductor Metrology Instruments - (193 companies)...optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers. Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. Today...Show More
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Wafer and Thin Film Instrumentation - (351 companies)Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.Show More
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Flexible Couplings - (459 companies)...or parallel offset orientation. Flexible coupling types include: Sliding block. Metal contoured diaphragm. Roller or silent chain. Steel grid. Coil spring. Wafer or flexible disc. Schmidt. Beam or flexured (helical). Gear or multi-jaw. Metal bellows...Show More
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Coated Abrasives - (211 companies)Coated abrasives are used for abrading, smoothing, or polishing.Show More
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Specialty Brushes - (95 companies)Specialty brushes use specialized or proprietary technologies, or feature brush designs for specific applications or industries.Show More
Product News
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Protomatic, Inc.
Contour Inspection Capability Protomatic has the capabiltiy to measure texture, form and contour simultaneously with our Taylor-Hobson Form Talysurf Intra . The "Tally Surf" measures complex internal and external profiles non-destructively for critical applications. (read more) -
Lapmaster-Wolters International
KDP Composite Plates Lapmaster series KDP Composite Plates for Diamond Lapping and Polishing. Materials available include Iron (primary lapping/roughing), Copper (all-around lap or polish processing), Ceramic (intermediate lap or polish with reduced staining, corrosion and conductivity attributes), Tin-Lead (finish polish) or XP (finish polish). Available in standard diameters of 12" to 36", although custom sizes (smaller and larger) and shapes available. Can be configured in most standard groove patterns including... (read more)Browse Surface Profilometers Datasheets for Lapmaster-Wolters International -
MS Bellows
Welded Bellows Several diaphragm contour designs are available. Each with different functional properties. Shown are the most popular. Variations of each contour are available to compliment your specific design application. Their engineering staff will gladly provide you with recommendations and design assistance. Nested Ripple Design. The nested ripple profile provides long stroking capability with linearity of stroke vs. pressure, plus very good resistance to pressure. This is the most commonly used design... (read more) -
Weldon Solutions
Weldon AGN4 Small Part OD CNC Grinder The AGN4 is designed to produce high precision small parts and is capable of plunge, contour, and traverse grinding operations. This compact machine occupies 30 square feet of space. More info... (read more)Browse Grinders and Grinding Machines Datasheets for Weldon Solutions -
Custom MMIC
Calculator Plots Phase and Amplitude Errors to Easily Manipulate Image Rejection New Calculator Plots Phase and Amplitude Errors to Easily Manipulate Image Rejection - Custom MMIC is pleased to introduce a new, easy-to-use Image Rejection Calculator to our suite of free online tools. This innovative new tool displays the contours of constant image rejection as a function of phase and amplitude error. After the user inputs a specific error condition, the program computes the image rejection and displays the result on the graph along with the contours. This visual... (read more) -
Micro-Epsilon Group
Automated inspection of curved surfaces In many areas, ever-increasing requirements are being placed on the quality and appearance of surfaces. Particularly with reflecting surfaces, faultless, high quality production is expected. The parts are often subjected to manual inspection, which can lead to defects being missed due to tiredness of the inspectors. The reflectCONTROL Automation system is designed for automatic surface inspection of components whose dimensions require several measuring positions. The system projects a striped... (read more)Browse Surface Profilometers Datasheets for Micro-Epsilon Group -
Weldon Solutions
Weldon AGN4 Precision Small Part OD CNC Grinder The AGN4 has been designed to produce high precision small parts and is capable of performing plunge, contour, and traverse grinding operations. This compact machine occupies only 30 square feet of floor space, but its standard configuration makes it adaptable for factory automation. The fully enclosed grinder is available with either a straight or 30° angular wheelhead. The grinder is equipped with a combination live/dead spindle workhead for versatility. Highly rigid hydrodynamic wheel... (read more)Browse Grinders and Grinding Machines Datasheets for Weldon Solutions -
LPKF Laser & Electronics North America
PowerWeld 2000 HMI, contour software and more are all encased in sleak, user friendly design. A Flexible Process. LPKF is a pioneer in quasi-simultaenous welding, with over 11 years experience welding with the technique. Modifications to the weld contour can be simply done by loading the new layout data into LPKF's proprietary laser welding software, ProSet. Changing from one product to the next requires minimal time and effort. (read more)Browse Laser Cutting and Welding Machines Datasheets for LPKF Laser & Electronics North America -
Lee Co. (The)
LPG Inert Solenoid Pump in standard 100 µL and 175 µL models, the LPG pump features low power consumption and a contoured end cap which provides secondary connector retention and is compatible with standard AMP connectors. (read more) -
Mahr Inc.
MarSurf LD130/260 Aspheric 2D/3D Measuring Station Mahr Federal has introduced a new high-precision 2D/3D measuring station for checking contour and surface topography of aspheric optical lenses and other components during multi-stage grinding and polishing operations. The MarSurf LD 130 and 260 Aspheric units feature high measuring speed, measuring range of up to 260 mm, vertical resolution of 0.8 nm, and form deviations of less than 100 nm. As with all Mahr metrology systems, the MarSurf LD 130 and 260 Aspheric are backed by Mahr's extensive... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Inc.
More Information
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Recent achievements and perspectives of holographic nondestructive testing
Two-color contour profilometer using BaTiO3 and two-wave mixing geometry.
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Mechanical and Thermal Properties of Hot-Pressed ZrB2 -SiC Composites
The surface roughness of the specimen was measure by non-contact type profilometer ( Contour GT-X, Bruker Corporation).
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Mechanical and Tribological Performance of Graphite/Silicon Nitride Composites: A Comparison between Pressureless and Spark Plasma Sinter Processing
Scar topographies were viewed through a non-contact surface profilometer ( Contour GT, M/s Bruker).
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Indentation size effect and wear characteristics of spark plasma sintered, hard MWCNT/Al2O3 nanocomposites
Scar topography and dimension were viewed through a non-contact surface profilometer ( Contour GT, M/s Bruker, USA).
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Mechanical, Tribological, and Thermal Properties of Hot‐Pressed Z r B 2 ‐ B 4 C Composite
The wear volume of the speci- men was measure by noncontact type 3D profilometer ( Contour GT-X, Bruker Corporation, Tucson, AZ).
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Mechanical, tribological and thermal properties of hot pressed ZrB2–SiC composite with SiC of different morphology
Wear resistance coefficient value was calculated from the standard formula.49 To calculate the wear volume, a number of two-dimensional surface profiles across the worn track surface were acquired using a non-contact surface profilometer ( Contour GT-X, Bruker, USA).
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Nano‐to‐Macroscale Poly(methyl methacrylate) Stereocomplex Assemblies
The profilometer contours for microwire 11 indicated that its width and height were approximately 137 and 97 mm, respectively.
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Determination of the Insoluble Aluminum Content in Steel Samples by Using Laser-Induced Breakdown Spectroscopysupported by National Key Scientific Instrument a...
The depth of the crater was determined using a 3D optical profilometer ( Contour GT, Bruker, Germany).
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Development of hydrophilic dental wax without surfactant using a non-thermal air atmospheric pressure plasma jet
To measure changes in the roughness (Ra, Sa) and the thermal effect of AAPPJ on DW, a 3D optical profilometer ( Contour GT-X3 base, Bruker, Germany) was used to visualize the differences in roughness before and after treatment, as described elsewhere [14].
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Mechanical Properties of Thin Free-Standing CYTOP Membranes
The membrane thickness was measured accurately by el- lipsometry and the width was obtained from the profilometer contour plots.
